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1. 
Cover image for Electronic Noise and Interfering Signals Principles and Applications
Electronic Noise and Interfering Signals Principles and Applications
Author 
Vasilescu, Gabriel. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b137720
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2. 
Cover image for Timing Performance of Nanometer Digital Circuits Under Process Variations
Timing Performance of Nanometer Digital Circuits Under Process Variations
Author 
Champac, Victor. author. Garcia Gervacio, Jose. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-75465-9
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3. 
Cover image for Flexible Electronics Materials and Applications
Flexible Electronics Materials and Applications
Author 
Salleo, Alberto. editor. Wong, William S. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-74363-9
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4. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-74747-7
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5. 
Cover image for Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Author 
Sachdev, Manoj. editor. Gyvez, José Pineda de. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-46547-2
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6. 
Cover image for Oscillation-Based Test in Mixed-Signal Circuits
Oscillation-Based Test in Mixed-Signal Circuits
Author 
Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-5315-0
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7. 
Cover image for Gizopoulos / Advances in ElectronicTesting
Gizopoulos / Advances in ElectronicTesting
Author 
Gizopoulos, Dimitris. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-29409-0
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8. 
Cover image for Digital Timing Measurements From Scopes and Probes to Timing and Jitter
Digital Timing Measurements From Scopes and Probes to Timing and Jitter
Author 
Maichen, Wolfgang. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-31419-8
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9. 
Cover image for The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
Author 
Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-34609-0
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10. 
Cover image for Introduction to Advanced System-on-Chip Test Design and Optimization
Introduction to Advanced System-on-Chip Test Design and Optimization
Author 
Larsson, Erik. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b135763
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11. 
Cover image for Fault Diagnosis of Analog Integrated Circuits
Fault Diagnosis of Analog Integrated Circuits
Author 
Kabisatpathy, Prithviraj. author. Barua, Alok. author. Sinha, Satyabroto. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b135977
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12. 
Cover image for Data Mining and Diagnosing IC Fails
Data Mining and Diagnosing IC Fails
Author 
Huisman, Leendert M. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137446
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