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37. 
Cover image for Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems
Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems
Author 
Seong, Poong Hyun. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84800-384-2
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38. 
Cover image for Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17–21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USA
Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17–21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USA
Author 
Boring, Ronald Laurids. editor. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-60645-3
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39. 
Cover image for Reliability Physics and Engineering Time-To-Failure Modeling
Reliability Physics and Engineering Time-To-Failure Modeling
Author 
McPherson, J. W. author. SpringerLink (Online service)
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ONLINE(332682.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00122-7
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40. 
Cover image for Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
Author 
Stanisavljević, Miloš. author. Schmid, Alexandre. author. Leblebici, Yusuf. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-6217-1
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41. 
Cover image for Assessment of Power System Reliability Methods and Applications
Assessment of Power System Reliability Methods and Applications
Author 
Čepin, Marko. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-688-7
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42. 
Cover image for Reliability Engineering Basic Concepts and Applications in ICT
Reliability Engineering Basic Concepts and Applications in ICT
Author 
Lazzaroni, Massimo. author. Cristaldi, Loredana. author. Peretto, Lorenzo. author. Rinaldi, Paola. author. Catelani, Marcantonio. author.
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http://dx.doi.org/10.1007/978-3-642-20983-3
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43. 
Cover image for Reliability Physics and Engineering Time-To-Failure Modeling
Reliability Physics and Engineering Time-To-Failure Modeling
Author 
McPherson, J.W. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-6348-2
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44. 
Cover image for Multi-state System Reliability Analysis and Optimization for Engineers and Industrial Managers
Multi-state System Reliability Analysis and Optimization for Engineers and Industrial Managers
Author 
Lisnianski, Anatoly. author. Frenkel, Ilia. author. Ding, Yi. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-84996-320-6
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45. 
Cover image for Handbook of Reliability, Availability, Maintainability and Safety in Engineering Design
Handbook of Reliability, Availability, Maintainability and Safety in Engineering Design
Author 
Stapelberg, Rudolph Frederick. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-84800-175-6
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46. 
Cover image for Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliability
Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliability
Author 
Bertsche, Bernd. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-34282-3
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47. 
Cover image for System Signatures and their Applications in Engineering Reliability
System Signatures and their Applications in Engineering Reliability
Author 
Samaniego, Francisco J. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-71797-5
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48. 
Cover image for Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
Author 
Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-32989-7
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