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37. 
Cover image for Semiconductor Lasers Stability, Instability and Chaos
Semiconductor Lasers Stability, Instability and Chaos
Author 
Ohtsubo, Junji. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333297.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-30147-6
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38. 
Cover image for Aligned Carbon Nanotubes Physics, Concepts, Fabrication and Devices
Aligned Carbon Nanotubes Physics, Concepts, Fabrication and Devices
Author 
Ren, Zhifeng. author. Lan, Yucheng. author. Wang, Yang. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333331.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-30490-3
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39. 
Cover image for High Mobility and Quantum Well Transistors Design and TCAD Simulation
High Mobility and Quantum Well Transistors Design and TCAD Simulation
Author 
Hellings, Geert. author. De Meyer, Kristin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(336218.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-6340-1
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40. 
Cover image for Transmission electron microscopy in micro-nanoelectronics
Transmission electron microscopy in micro-nanoelectronics
Author 
Claverie, A. (Alain)
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ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1117321
John Wiley http://dx.doi.org/10.1002/9781118579022
Safari Books Online http://proquest.safaribooksonline.com/?fpi=9781118579053
Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118579022
Volltext http://proquest.tech.safaribooksonline.de/9781118579053
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41. 
Cover image for Introduction to Thin Film Transistors Physics and Technology of TFTs
Introduction to Thin Film Transistors Physics and Technology of TFTs
Author 
Brotherton, S.D. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332657.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00002-2
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42. 
Cover image for Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Author 
van Schooten, Kipp. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332776.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00590-4
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43. 
Cover image for Toward Quantum FinFET
Toward Quantum FinFET
Author 
Han, Weihua. editor. Wang, Zhiming M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332897.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-02021-1
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44. 
Cover image for FIB Nanostructures
FIB Nanostructures
Author 
Wang, Zhiming M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332951.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-02874-3
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45. 
Cover image for GaP Heteroepitaxy on Si(100) Benchmarking Surface Signals when Growing GaP on Si in CVD Ambients
GaP Heteroepitaxy on Si(100) Benchmarking Surface Signals when Growing GaP on Si in CVD Ambients
Author 
Döscher, Henning. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332952.1)
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http://dx.doi.org/10.1007/978-3-319-02880-4
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46. 
Cover image for High-Performance D/A-Converters Application to Digital Transceivers
High-Performance D/A-Converters Application to Digital Transceivers
Author 
Clara, Martin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333409.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-31229-8
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47. 
Cover image for Bismuth-Containing Compounds
Bismuth-Containing Compounds
Author 
Li, Handong. editor. Wang, Zhiming M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332391.1)
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http://dx.doi.org/10.1007/978-1-4614-8121-8
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48. 
Cover image for Low Dimensional Semiconductor Structures Characterization, Modeling and Applications
Low Dimensional Semiconductor Structures Characterization, Modeling and Applications
Author 
Ünlü, Hilmi. editor. Horing, Norman J. M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333183.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-28424-3
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