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Author

SpringerLink (Online service)

(6)

Brown, William D., 1943-

(2)

Greenhouse, Hal.

(2)

Ulrich, Richard K. (Richard Kevin), 1955-

(2)

Agarwal, Rakish, author.

(1)

Avtgis, Alexander W.

(1)

Barlow, Fred D.

(1)

Bath, Jasbir, editor.

(1)

Blackwell, Glenn R.

(1)

Carney, Charles (Charles F.)

(1)

Cepeda-Rizo, Juan, author.

(1)

Chen, Chih, 1970- author.

(1)

Chen, Hung-Ming, author.

(1)

(1)

Cressler, John D.

(1)

Del Castillo, Enrique.

(1)

Dishongh, Terrance J., author.

(1)

Domingo, George, 1937- author.

(1)

Dorf, Richard C.

(1)

Elshabini, Aicha.

(1)

Gayle, Jeremiah, author.

(1)

Gerlach, Gerald. editor.

(1)

(1)

Huang, Wei, editor.

(1)

Hurwitz, Arnon Max.

(1)

(1)

Jamnia, Ali, 1961- author.

(1)

Javadpour, Sirus, author.

(1)

Keser, Beth, 1971- editor.

(1)

Kroehnert, Steffen, 1970- editor.

(1)

Lee, Ning-Cheng.

(1)

(1)

Lee, Y. C. editor.

(1)

Li, Yi (Grace). editor.

(1)

Licari, James J., 1930-

(1)

Liu, S. (Sheng), 1963-

(1)

Liu, Yong. author.

(1)

Lorenzelli, Leandro, author.

(1)

Lowry, Robert (Robert K.), 1944-

(1)

Luo, Xiaobing, 1974-

(1)

Madhava Rao, K., editor.

(1)

Mahajan, Rahul, author.

(1)

Manjakkal, Libu, author.

(1)

Manning, Louise, editor.

(1)

Mantooth, H. Alan, 1963-

(1)

Martín, Ferran, 1965- author.

(1)

McCluskey, F. Patrick, author.

(1)

Megow, William F.

(1)

Meng, Hong, editor.

(1)

Monkhouse, Donald C.

(1)

Moon, Kyoung-Sik. editor.

(1)

(1)

Muñoz-Enano, Jonathan, author.

(1)

Nakamura, Shozo (Professor Emeritus), author.

(1)

Osten, Wolfgang.

(1)

Pecht, Michael, author.

(1)

Pecht, Michael.

(1)

Pengelly, Raymond S.

(1)

Puttlitz, Karl J.

(1)

Ravich, Joshua, author.

(1)

Remsburg, Ralph., author.

(1)

Romenesko, Bruce.

(1)

Sharif, Ahmed, editor.

(1)

Stalter, Kathleen A.

(1)

Su, Lijuan, author.

(1)

Suganuma, Katsuaki.

(1)

Suhir, E. editor.

(1)

Suhir, Ephraim.

(1)

Swanson, Dale W.

(1)

Süli, Frank, author.

(1)

Tai-Ran Hsu, ed.

(1)

Tenhunen, Hannu, author.

(1)

Tian, Xingyou, editor.

(1)

Tong, Xingcun Colin. author.

(1)

Tu, K. N. (King-Ning), 1937- author.

(1)

Vasudeva Reddy, T., editor.

(1)

Villanucci, Robert S., 1944-

(1)

Voyiadjis, George Z. editor.

(1)

Vélez, Paris, author.

(1)

Walker, C. A. (Colin A.)

(1)

Whitaker, Jerry C.

(1)

Willander, M., author.

(1)

Wolter, Klaus-Jürgen. editor.

(1)

(1)

Wong, C. P. editor.

(1)

Wong, C.P. editor.

(1)

Zapka, Werner, editor.

(1)

Zha, Jun-Wei, editor.

(1)

Zheng, Li-Rong, author.

(1)

Zou, Zhuo, author.

(1)

Language

(49)

Publication Date

-

(4)

(4)

(4)

(3)

(3)

(3)

(3)

(3)

(3)

(2)

(2)

(2)

(2)

(2)

(2)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Subject

Electronic packaging.

(22)

Electronic books.

(11)

(8)

TECHNOLOGY & ENGINEERING.

(6)

Mise sous boîtier (Électronique)

(5)

Microelectronics.

(4)

Solder and soldering.

(4)

Chip scale packaging.

(3)

Electronic apparatus and appliances -- Design and construction.

(3)

(3)

Extreme environments.

(3)

Microelectronic packaging.

(3)

Nanotechnology.

(3)

Optical materials.

(3)

TECHNOLOGY & ENGINEERING -- Mechanical.

(3)

(2)

Electronic apparatus and appliances -- Reliability.

(2)

Electronic packaging

(2)

Electronic packaging -- Materials.

(2)

Electronics -- Materials -- Permeability.

(2)

(2)

(2)

Sealing (Technology)

(2)

Semiconductors.

(2)

Surfaces (Physics).

(2)

(1)

(1)

Aerospace engineering.

(1)

Aliments -- Industrie et commerce -- Grande-Bretagne -- Qualité -- Contrôle.

(1)

Amplifiers (Electronics).

(1)

(1)

Biomedical engineering.

(1)

(1)

Boîtiers à puce.

(1)

Building materials.

(1)

COMPUTERS / Programming / Algorithms

(1)

Capteurs intelligents.

(1)

Ceramic materials.

(1)

(1)

Chip scale packaging

(1)

Circuits imprimés.

(1)

Circuits intégrés -- Intégration sur la plaquette.

(1)

Circuits intégrés.

(1)

(1)

Classical Mechanics.

(1)

Conducting polymers.

(1)

Contamination (Technology)

(1)

(1)

Dichtung (Technik)

(1)

(1)

Drugs -- Testing.

(1)

Détecteurs à micro-ondes.

(1)

Eau -- Qualité -- Mesure.

(1)

Eau -- Qualité -- Télédétection.

(1)

Electric connectors.

(1)

Electric lighting -- Equipment and supplies.

(1)

(1)

Electromagnetics & Microwaves

(1)

Electronic Packaging

(1)

Electronic apparatus and appliances

(1)

Electronic apparatus and appliances -- Thermal properties.

(1)

Electronic apparatus and appliances.

(1)

Electronic ceramics.

(1)

Electronic circuits -- Handbooks, manuals, etc.

(1)

Electronic packaging -- Defects -- Prevention.

(1)

Electronic packaging -- Handbooks, manuals, etc.

(1)

Electronics -- Materials -- Effect of temperature on.

(1)

Electronics -- Materials.

(1)

Elektronik aygıtlar ve aletler -- Tasarım ve yapım.

(1)

Elektronik paketleme -- Kusurlar -- Korunma.

(1)

Elektronik paketleme.

(1)

Elektronisches Bauelement.

(1)

Engineering -- Handbooks, manuals, etc.

(1)

Engineering Mechanics.

(1)

Engineering design.

(1)

Environmental protection.

(1)

Environmental testing.

(1)

(1)

Extreme environments

(1)

Fabrika sağlıklaştırımı.

(1)

Factory sanitation.

(1)

Field-effect transistors.

(1)

Food industry and trade -- Great Britain -- Quality control.

(1)

Food industry and trade -- Quality control

(1)

Gallium arsenide.

(1)

(1)

Green products.

(1)

Heat -- Transmission.

(1)

Heat resistant materials

(1)

Heat resistant materials.

(1)

Ink-jet printing

(1)

Ink-jet printing.

(1)

Integrated circuits -- Wafer-scale integration

(1)

Integrated circuits -- Wafer-scale integration.

(1)

Intelligent sensors

(1)

Intelligent sensors.

(1)

Interconnects (Integrated circuit technology) -- Design and construction.

(1)

Kontaminasyon (Teknoloji)

(1)

Light emitting diodes -- Computer simulation.

(1)

Light emitting diodes -- Design and construction.

(1)

Materials at high temperatures

(1)

Materials at high temperatures.

(1)

Matériaux réfractaires.

(1)

Matériaux à hautes températures.

(1)

Mechanics, Applied.

(1)

(1)

Microelectromechanical systems.

(1)

Microfabrication.

(1)

Micromechanics.

(1)

Microwave detectors

(1)

Microwave detectors.

(1)

Microwave transistors.

(1)

Mikroelektronik.

(1)

Milieux extrêmes.

(1)

Mise sous boîtier (Microélectronique)

(1)

Mise sous boîtier (Électronique) -- Matériaux.

(1)

Mixing circuits.

(1)

Moire method -- Case studies.

(1)

(1)

Nanostructured materials.

(1)

Optical detectors -- Industrial applications.

(1)

Optoelectronic devices.

(1)

Optoelectronics.

(1)

Optoelektronik.

(1)

Oscillators, Electric.

(1)

Particles (Nuclear physics).

(1)

Passive components.

(1)

(1)

(1)

Polymères conducteurs.

(1)

Printed electronics

(1)

Printed electronics.

(1)

Production management.

(1)

Production of electric energy or power.

(1)

Quality Control.

(1)

Quality control -- Optical methods.

(1)

Sealing (Technology).

(1)

Semi-conducteurs.

(1)

Semiconductor industry -- Production control.

(1)

(1)

Semiconductors -- Design and construction.

(1)

(1)

Silicon -- Electric properties

(1)

Silicon -- Electric properties.

(1)

Silicones -- Propriétés électroniques.

(1)

Solder and soldering

(1)

Solid Mechanics.

(1)

Solid state electronics

(1)

Solid state electronics.

(1)

(1)

(1)

Space vehicles -- Electronic equipment -- Design and construction.

(1)

Structural Materials.

(1)

(1)

Systems engineering.

(1)

Systèmes électroniques.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- Semiconductors.

(1)

TECHNOLOGY & ENGINEERING -- Food Science.

(1)

TECHNOLOGY / Engineering / Civil

(1)

TECHNOLOGY / Engineering / Mechanical

(1)

Telecommunication.

(1)

(1)

Water quality -- Measurement

(1)

Water quality -- Measurement.

(1)

Water quality -- Remote sensing

(1)

Water quality -- Remote sensing.

(1)

(1)

(1)

(1)

Électronique -- Matériaux -- Effets de la température sur.

(1)

Électronique de l'état solide.

(1)

Material Type

Shelf Location

Beytepe General Collection

Electronic Library

Taylor Francis E-Book Collection

Wiley E-Book Collection

Library

Beytepe Library

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1.

Cover image for Optical inspection of microsystems

Optical inspection of microsystems

Optical inspection of microsystems

Author

Osten, Wolfgang.

Preferred Shelf Number

TS156.2 .O652 2007

Electronic Access

Click here to view.

Format:

Availability

Online Library~1

Available:
Copies:

2.

Cover image for Drug products for clinical trials

Drug products for clinical trials

Drug products for clinical trials

Author

Monkhouse, Donald C. Carney, Charles (Charles F.) Clark, Jim.

Preferred Shelf Number

RM301.27 .D796 2006

Electronic Access

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Format:

Availability

Online Library~1

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3.

Cover image for Adhesives technology for electronic applications materials, processes, reliability

Adhesives technology for electronic applications materials, processes, reliability

Adhesives technology for electronic applications materials, processes, reliability

Author

Licari, James J., 1930- Swanson, Dale W.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780815515135

Format:

Availability

Online Library~1

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4.

Cover image for The electronics handbook

The electronics handbook

The electronics handbook

Author

Whitaker, Jerry C.

Preferred Shelf Number

TK7867 .E4244 2005

Electronic Access

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Format:

Availability

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5.

Cover image for The engineering handbook

The engineering handbook

The engineering handbook

Author

Dorf, Richard C.

Preferred Shelf Number

TA151 .E424 2005

Electronic Access

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6.

Cover image for MEMS Packaging

Author

Tai-Ran Hsu, ed.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBEP003E

Format:

Availability

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7.

Cover image for Lead-free soldering in electronics : science, technology and environmental impact

Lead-free soldering in electronics : science, technology and environmental impact

Lead-free soldering in electronics : science, technology and environmental impact

Author

Suganuma, Katsuaki.

Preferred Shelf Number

TK7870.15 .L43 2004

Electronic Access

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Format:

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8.

Cover image for Handbook of Moire measurement

Handbook of Moire measurement

Handbook of Moire measurement

Author

Walker, C. A. (Colin A.)

Preferred Shelf Number

QC415 .H27 2004

Electronic Access

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9.

Cover image for Handbook of lead-free solder technology for microelectronic assemblies

Handbook of lead-free solder technology for microelectronic assemblies

Handbook of lead-free solder technology for microelectronic assemblies

Author

Puttlitz, Karl J. Stalter, Kathleen A.

Preferred Shelf Number

TK7870.15 .H3657 2004

Electronic Access

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10.

Cover image for Reflow soldering processes SMT, BGA, CSP and flip chip technologies

Reflow soldering processes SMT, BGA, CSP and flip chip technologies

Reflow soldering processes SMT, BGA, CSP and flip chip technologies

Author

Lee, Ning-Cheng.

Preferred Shelf Number

ONLINE

Electronic Access

Volltext http://www.sciencedirect.com/science/book/9780750672184

Format:

Availability

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11.

Cover image for Thermal design of electronic equipment

Thermal design of electronic equipment

Thermal design of electronic equipment

Author

Remsburg, Ralph., author.

Preferred Shelf Number

TK7870.25 .R46 2001

Electronic Access

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Format:

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12.

Cover image for Run-to-run control in semiconductor manufacturing

Run-to-run control in semiconductor manufacturing

Run-to-run control in semiconductor manufacturing

Author

Del Castillo, Enrique. Hurwitz, Arnon Max. Moyne, James.

Preferred Shelf Number

TK7871.85 .R863 2001

Electronic Access

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