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1. 
Cover image for Achieving Product Reliability : A Key to Business Success.
Achieving Product Reliability : A Key to Business Success.
Author 
Doganaksoy, Necip, 1960- author. Meeker, William Q., author. Hahn, Gerald J., author.
Preferred Shelf Number 
TS156
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003181361
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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2. 
Cover image for Mendelian randomization : methods for causal inference using genetic variants
Mendelian randomization : methods for causal inference using genetic variants
Author 
Burgess, Stephen, author. Thompson, S. G. (Simon G.) (Professor in biostatistics), author.
Preferred Shelf Number 
RB155
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429324352
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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3. 
Cover image for Scientometrics for the humanities and social sciences
Scientometrics for the humanities and social sciences
Author 
Sooryamoorthy, R., author.
Preferred Shelf Number 
Z669.8 .S66 2021
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003110415
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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4. 
Cover image for Multiple objective analytics for criminal justice systems
Multiple objective analytics for criminal justice systems
Author 
Evans, Gerald W., author.
Preferred Shelf Number 
HV7415
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003054993
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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5. 
Cover image for Safety metrics for the modern safety professional
Safety metrics for the modern safety professional
Author 
Lopez, Gary, author.
Preferred Shelf Number 
T55.3 .S72 L67 2021
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003088332
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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6. 
Cover image for Statistical reasoning for surgeons
Statistical reasoning for surgeons
Author 
Maltenfort, Mitchell G., author. Restrepo, Camilo, author. Chen, Antonia, author.
Preferred Shelf Number 
RA409
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781315107875
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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7. 
Cover image for Understanding China through big data : applications of theory-oriented quantitative approaches
Understanding China through big data : applications of theory-oriented quantitative approaches
Author 
Chen, Yunsong, 1975- author. He, Guangye, author. Yan, Fei, 1982- author.
Preferred Shelf Number 
HM578 .C6
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003164166
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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8. 
Cover image for Geostatistics for the mining industry : applications to porphyry copper deposits
Geostatistics for the mining industry : applications to porphyry copper deposits
Author 
Emery, Xavier, author. Séguret, Serge Antoine, author.
Preferred Shelf Number 
TN444 .C5 E4413 2021
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003050469
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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9. 
Cover image for Modern industrial statistics : with applications in R, MINITAB and JMP
Modern industrial statistics : with applications in R, MINITAB and JMP
Author 
Kenett, Ron, author. Zacks, Shelemyahu, 1932- author. Amberti, Daniele, author.
Preferred Shelf Number 
TS156 .K46 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119714941
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10. 
Cover image for Industrial data analytics for diagnosis and prognosis : a random effects modelling approach
Industrial data analytics for diagnosis and prognosis : a random effects modelling approach
Author 
Zhou, Shiyu, 1970- author. Chen, Yong (Professor of industrial and systems engineering), author.
Preferred Shelf Number 
T57.35 .Z56 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119666271
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11. 
Cover image for Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Author 
Dahoo, Pierre Richard. Pougnet, Philippe. El Hami, Abdelkhalak.
Preferred Shelf Number 
QC88
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244
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12. 
Cover image for Individual participant data meta-analysis : a handbook for healthcare research
Individual participant data meta-analysis : a handbook for healthcare research
Author 
Riley, Richard D., editor. Tierney, Jayne F., editor. Stewart, Lesley A., editor.
Preferred Shelf Number 
R853 .S7 I53 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119333784
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