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49. 
Cover image for Modern electronics and communication engineering
Modern electronics and communication engineering
Author 
Anand, M. L., author.
Preferred Shelf Number 
TK7815
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003222972
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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50. 
Cover image for Nanocarbon Electronics
Nanocarbon Electronics
Author 
Zhou, Changjian. Zhang, Min. Yang, Cary Y.
Preferred Shelf Number 
TK7835
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003043089
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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51. 
Cover image for Electronics : from classical to quantum
Electronics : from classical to quantum
Author 
Kolawole, Michael O., author.
Preferred Shelf Number 
TK7815
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003052913
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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52. 
Cover image for Understanding Error Control Coding
Understanding Error Control Coding
Author 
Sanvicente, Emilio. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-05840-1
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53. 
Cover image for Automated Broad and Narrow Band Impedance Matching for RF and Microwave Circuits
Automated Broad and Narrow Band Impedance Matching for RF and Microwave Circuits
Author 
Banerjee, Amal. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-99001-9
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54. 
Cover image for Device Physics, Modeling, Technology, and Analysis for Silicon MESFET
Device Physics, Modeling, Technology, and Analysis for Silicon MESFET
Author 
Amiri, Iraj Sadegh. author. Mohammadi, Hossein. author. Hosseinghadiry, Mahdiar. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-04513-5
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55. 
Cover image for Instruments, Measurement Principles and Communication Technologies for Downhole Drilling Environments
Instruments, Measurement Principles and Communication Technologies for Downhole Drilling Environments
Author 
Gooneratne, Chinthaka P. author. Li, Bodong. author. Deffenbaugh, Max. author. Moellendick, Timothy. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-04900-3
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56. 
Cover image for Projected Capacitive Touch A Practical Guide for Engineers
Projected Capacitive Touch A Practical Guide for Engineers
Author 
Gray, Tony. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-98392-9
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57. 
Cover image for Security Policy in System-on-Chip Designs Specification, Implementation and Verification
Security Policy in System-on-Chip Designs Specification, Implementation and Verification
Author 
Ray, Sandip. author. Basak, Abhishek. author. Bhunia, Swarup. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-93464-8
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58. 
Cover image for Radiation Effects on Integrated Circuits and Systems for Space Applications
Radiation Effects on Integrated Circuits and Systems for Space Applications
Author 
Velazco, Raoul. editor. McMorrow, Dale. editor. Estela, Jaime. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-04660-6
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59. 
Cover image for Advances in Biometrics Modern Methods and Implementation Strategies
Advances in Biometrics Modern Methods and Implementation Strategies
Author 
Sinha, G.R. editor. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-030-30436-2
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60. 
Cover image for Proceedings of the Third International Conference on Microelectronics, Computing and Communication Systems MCCS 2018
Proceedings of the Third International Conference on Microelectronics, Computing and Communication Systems MCCS 2018
Author 
Nath, Vijay. editor. Mandal, Jyotsna Kumar. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-7091-5
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