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49. 
Cover image for Photoresist Technology in Microsystems: Principles, Processes and Applications
Photoresist Technology in Microsystems: Principles, Processes and Applications
Author 
Wang, Kaiying. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-95-1606-3
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50. 
Cover image for Advances in Micro-Electronics, Embedded Systems and IoT Proceedings of Ninth International Conference on Microelectronics Electromagnetics and Telecommunications (ICMEET 2024), Volume 1
Advances in Micro-Electronics, Embedded Systems and IoT Proceedings of Ninth International Conference on Microelectronics Electromagnetics and Telecommunications (ICMEET 2024), Volume 1
Author 
Bhateja, Vikrant. editor. Anguera, Jaume. editor. Ghosh, Anumoy. editor. (orcid)0000-0003-4865-5893 Chowdary, P. Satish Rama. editor. (orcid)0000-0002-1649-4258 SpringerLink (Online service)
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https://doi.org/10.1007/978-981-96-7222-6
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51. 
Cover image for Advancements in VLSI Design, Microelectronics Devices and Circuits Select Proceedings of SPIN 2025, Volume 5
Advancements in VLSI Design, Microelectronics Devices and Circuits Select Proceedings of SPIN 2025, Volume 5
Author 
Kumar, Pradeep. editor. Navaraj, William. editor. Moreira, Fernando. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-96-9231-6
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52. 
Cover image for A Problem-Solving Approach to Electric Circuits Volume I
A Problem-Solving Approach to Electric Circuits Volume I
Author 
Asadi, Farzin. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-95623-2
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53. 
Cover image for Next-generation electrochromic devices : from multifunctional materials to smart glasses
Next-generation electrochromic devices : from multifunctional materials to smart glasses
Author 
Cossari, Pierluigi, author.
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TA1750 .C67 2025
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https://onlinelibrary.wiley.com/doi/book/10.1002/9783527832583
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54. 
Cover image for Fundamentals of VHDL for FPGA programming using Vivado
Fundamentals of VHDL for FPGA programming using Vivado
Author 
Pakdel, Majid, author.
Preferred Shelf Number 
TK7885.7
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https://onlinelibrary.wiley.com/doi/book/10.1002/9781394343126
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55. 
Cover image for Silicon Components and Processes Self Study Field-Effect Transistors
Silicon Components and Processes Self Study Field-Effect Transistors
Author 
El-Kareh, Badih. author. Hutter, Lou N. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-59193-8
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56. 
Cover image for Embedded Machine Learning with Microcontrollers Applications on STM32 Development Boards
Embedded Machine Learning with Microcontrollers Applications on STM32 Development Boards
Author 
Ünsalan, Cem. author. (orcid)0000-0002-8904-3730 Höke, Berkan. author. (orcid)0000-0001-5682-500X Atmaca, Eren. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-70912-8
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57. 
Cover image for Advanced Techniques for Assertion-Based Verification in Hardware Designs Using Data Mining Algorithms
Advanced Techniques for Assertion-Based Verification in Hardware Designs Using Data Mining Algorithms
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Heidari Iman, Mohammad Reza. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-90410-3
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58. 
Cover image for Micro- and Nano-Systems in 21st-Century Designs, Developments, Applications and Perspective
Micro- and Nano-Systems in 21st-Century Designs, Developments, Applications and Perspective
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Pachkawade, Vinayak. editor. Guha, Koushik. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-96-4659-3
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59. 
Cover image for Analog Microelectronics
Analog Microelectronics
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Borgarino, Mattia. author. (orcid)0000-0001-9678-592X SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-94286-0
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60. 
Cover image for Alternating Current Field Measurement Technique for Detection and Measurement of Cracks in Structures
Alternating Current Field Measurement Technique for Detection and Measurement of Cracks in Structures
Author 
Li, Wei. author. Yuan, Xin'an. author. Zhao, Jianming. author. Yin, Xiaokang. author. Li, Xiao. author.
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https://doi.org/10.1007/978-981-97-7255-1
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