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Hottinen, Ari. Tirkkonen, Olav. Wichman, Risto.
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HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/50898554.html
John Wiley http://dx.doi.org/10.1002/0470014083
Wiley InterScience - Full text online http://onlinelibrary.wiley.com/book/10.1002/0470014083
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Vucetic, Branka. Yuan, Jinhong, 1969- John Wiley & Sons.
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Kularatna, Nihal
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Hanzo, Lajos, 1952- John Wiley & Sons.
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Leondes, Cornelius T.
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Vucetic, Branka. Yuan, Jinhong, 1969-
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TK 5102.92 V82 2003
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Haykin, Simon S. Van Veen, Barry, ort. yaz.
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TK 5102.5 H37 2003
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Paulraj, Arogyaswami. Nabar, Rohit, ort. yaz. Gore, Dhananjay, ort. yaz.
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TK 5103.2 P39 2003
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Kester, Walt. Analog Devices, inc.
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Vaughan, Rodney Bach-Anderson, J�rg
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Bishop, Robert H., 1957- ISA--The Instrumentation, Systems, and Automation Society.
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Horan, Stephen John, 1954-
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Fischer, Robert F. H., 1966- Institute of Electrical and Electronics Engineers.
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Howard, Roy M. John Wiley & Sons.
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Rangayyan, Rangaraj M.
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Singh, Raminderpal.
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Baura, Gail D.
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Hanzo, Lajos, 1952- Liew, T. H. (Tong Hooi) Yeap, B. L. (Bee Leong)
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Liptk̀, Bľa G. Liptk̀, Bľa G. Instrument engineers' handbook. Process measurement and analysis. Liptk̀, Bľa G. Instrument engineers' handbook. Process control.
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Van Trees, Harry L.
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TK 5102.5 V3 2001 V.4
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Sarkar, Tapan. Salazar-Palma, Magdalena, ort. yaz. Wicks, Michael C., ort. yaz.
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TK 5102.9 S363 2002
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Chen, Victor C. Ling, Hao, ort. yaz.
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TK 6578 C44 2002
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Gatherer, Alan. Auslander, Edgar.
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Benvenuto, Nevio. Cherubini, Giovanni, 1957-
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Zölzer, Udo. Amatriain, Xavier. John Wiley & Sons.
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Tuttlebee, Wally H. W., 1953-
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ONLINE(318812.1)
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Shafi, Mansoor, 1950- Ogose, Shigeaki. Hattori, Takeshi, 1945-
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Kartalopoulos, Stamatios V.
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Dempster, John, 1956- Dempster, John, 1956- Computer analysis of electrophysiological signals.
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Wirth, Wulf-Dieter
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Akansu, Ali N., 1958- Haddad, Richard A.
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Schobben, Daniel W. E.
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TK 5102.9 S369 2001
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Akansu, Ali N., 1958- Haddad, Richard A.
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ONLINE
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Mertins, Alfred. Wiley InterScience (Online service)
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ONLINE
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Kamen, Edward W. Heck, Bonnie S., ort. yaz.
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TK 5102.9 K3523 2000
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Knight, Dick. John Wiley & Sons.
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Flandrin, Patrick.
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Ibbotson, L.
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Hickman, Ian.
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Wanhammar, Lars.
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International Federation of Automatic Control. World Congress (14th : 1999 : Beijing, China) Chen, Han-Fu, ed. Cheng, Dai-Zhan, ed. Zhang, Ji-Feng, ed.
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TJ 212.2 I58 1999 V.A
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Zeevi, Y. Y. Coifman, Ronald R. (Ronald Raphaël)
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Carmona, R. (René) Hwang, Wen-Liang. Torrésani, Bruno.
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Hurst, Stanley L.
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Rosenthal, David F., ed. Okuno, Hiroshi G., ed.
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TK 7895.S65 C66 1998
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Mahafza, Bassem R.
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TK6575 .M26 1998
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Cherkassky, Vladimir S. Mulier, Filip, ort. yaz.
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TK 5102.9 C475 1998
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Burrus, C. S. Gopinath, Ramesh A. Guo, Haitao.
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QA 403.3 B87 1998
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Starck, J.-L. (Jean-Luc), 1965- Murtagh, Fionn. Bijaoui, A.
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Q183.9 S83 1998
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Lee, Te-Won.
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TK5102.9 L44 1998
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Berg, Olav Berg, Terv Haavik, Svein Hjelmstad, Jens Skaug, Reidar
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Sabin, William E., ed. Schoenike, Edgar O., ed.
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Antsaklis, Panos J. Michel, Anthony N., ort. yaz.
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TJ 220 A58 1997
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Toumazou, C. (Chris) Battersby, N. C. (Nicholas C.) Porta, Sonia. IEEE International Symposium on Circuits and Systems (1994 : London, England)
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Rutledge, D. N. (Douglas N.)
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Leondes, Cornelius T.
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Smith, Winthrop W., 1944- Smith, Joanne M., 1947-
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Akansu, Ali N., 1958- Haddad, Richard A.
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Gersho, Allen. Gray, Robert M., 1943- ort. yaz.
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TK 5102.5 G45 1991
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Haddad, Paul R. Akansu, Ali N.
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ONLINE(312979.1)
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Soin, R. S., ed. Maloberti, F., ed. Franca, J., ed.
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Harris, C. J., ed. White, I., ed.
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Farina, A., ed.
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Karpovsky, Mark G. International Workshop on Spectral Techniques and Fault Detection (1983 : Boston, Mass.)
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Qureshi, Shehrzad, 1973-
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TK5102.9 Q94
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