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49. 
Cover image for Handbook of Measurement Error Models.
Handbook of Measurement Error Models.
Author 
Yi, Grace Y. Delaigle, Aurore. Gustafson, Paul
Preferred Shelf Number 
QA275
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781315101279
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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50. 
Cover image for Ice adhesion : mechanism, measurement and mitigation
Ice adhesion : mechanism, measurement and mitigation
Author 
Mittal, K. L., 1945- editor. Choi, Chang-Hwan, 1973- editor.
Preferred Shelf Number 
TA714.5 .I23 2020 EB
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119640523
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51. 
Cover image for Depressive Disorders: Mechanisms, Measurement and Management
Depressive Disorders: Mechanisms, Measurement and Management
Author 
Fang, Yiru. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-32-9271-0
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52. 
Cover image for Measurement in Machining and Tribology
Measurement in Machining and Tribology
Author 
Davim, J. Paulo. editor. (orcid)0000-0002-5659-3111 SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-03822-9
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53. 
Cover image for Contactless VLSI Measurement and Testing Techniques
Contactless VLSI Measurement and Testing Techniques
Author 
Sayil, Selahattin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-69673-7
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54. 
Cover image for Thermal properties measurement of materials
Thermal properties measurement of materials
Author 
Jannot, Yves, author. Degiovanni, Alain, author.
Preferred Shelf Number 
TA418.24
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119475057
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55. 
Cover image for Measurement technology for micro-nanometer devices
Measurement technology for micro-nanometer devices
Author 
Zhang, Wendong, author.
Preferred Shelf Number 
TA418.9 .N35
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781118717974
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56. 
Cover image for OPTICAL METHODS OF MEASUREMENT : wholefield techniques.
OPTICAL METHODS OF MEASUREMENT : wholefield techniques.
Author 
SIROHI, RAJPAL.
Preferred Shelf Number 
QC367
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781315221359
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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57. 
Cover image for Traffic Measurement for Big Network Data
Traffic Measurement for Big Network Data
Author 
Chen, Shigang. author. Chen, Min. author. Xiao, Qingjun. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-47340-6
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58. 
Cover image for OSS Reliability Measurement and Assessment
OSS Reliability Measurement and Assessment
Author 
Yamada, Shigeru. author. Tamura, Yoshinobu. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-31818-9
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59. 
Cover image for Robust Multimodal Cognitive Load Measurement
Robust Multimodal Cognitive Load Measurement
Author 
Chen, Fang. author. Zhou, Jianlong. author. Wang, Yang. author. Yu, Kun. author. Arshad, Syed Z. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-31700-7
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60. 
Cover image for Adhesion measurement of films and coatings
Adhesion measurement of films and coatings
Author 
Mittal, Kash L., 1945- editor. Taylor and Francis.
Preferred Shelf Number 
QC183
Electronic Access 
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