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(23)
Liang, Qilian. editor.
(4)
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(4)
Zhang, Baoju. editor.
(4)
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(3)
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(3)
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(2)
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(2)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
Fujiwara, Hideo.
(1)
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(1)
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(1)
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(1)
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(1)
Hayes, John P. author.
(1)
Heiserman, David L., 1940-
(1)
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(1)
Heynes, Michael.
(1)
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(1)
Hossain, Razak.
(1)
Hsu, Sheng-Fu.
(1)
IEEE Circuits and Systems Society.
(1)
IEEE Solid-State Circuits Society.
(1)
Joachim, Christian. editor.
(1)
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(1)
John Wiley & Sons.
(1)
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(1)
Karchmer, Mauricio.
(1)
Ker, Ming-Dou.
(1)
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(1)
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(1)
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(1)
Lala, Parag K., 1948-
(1)
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(1)
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(1)
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(1)
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(1)
Maxfield, Clive, 1957-
(1)
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(1)
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(1)
Musatov, Daniil V. editor.
(1)
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(1)
Ndjountche, Tertulien.
(1)
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(1)
Omura, Y. (Yasuhisa)
(1)
Pal, Ajit. author.
(1)
Palumbo, Gaetano. author.
(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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Electronic circuits.
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CMOS (Circuit intégré)
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(1)
Circuit intégré à très grande échelle.
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Circuit logique.
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Circuits and Systems.
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Field programmable gate arrays.
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Informatique -- Mathématiques.
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49.
Communication complexity a new approach to circuit depth
Communication complexity a new approach to circuit depth
Author
Karchmer, Mauricio.
Preferred Shelf Number
ONLINE
Electronic Access
IEEE Xplore
http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267292
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50.
Logic testing and design for testability
Logic testing and design for testability
Author
Fujiwara, Hideo.
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ONLINE
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http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264
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