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49. 
Cover image for Standardized Functional Verification
Standardized Functional Verification
Author 
Wiemann, Alan. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-71733-3
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50. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
Author 
Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-75728-5
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51. 
Cover image for Low-Power High-Level Synthesis for Nanoscale CMOS Circuits
Low-Power High-Level Synthesis for Nanoscale CMOS Circuits
Author 
Patra, Priyardarsan. author. Kougianos, Elias. author. Ranganathan, Nagarajan. author. Mohanty, Saraju P. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-76474-0
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52. 
Cover image for CMOS Active Inductors and Transformers Principle, Implementation, and Applications
CMOS Active Inductors and Transformers Principle, Implementation, and Applications
Author 
Yuan, Fei. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-76479-5
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53. 
Cover image for System Verilog for Verification A Guide to Learning the Testbench Language Features
System Verilog for Verification A Guide to Learning the Testbench Language Features
Author 
Spear, Chris. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-76530-3
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54. 
Cover image for Inverse Problems in Electric Circuits and Electromagnetics
Inverse Problems in Electric Circuits and Electromagnetics
Author 
Chechurin, V. L. author. Korovkin, N. V. author. Hayakawa, M. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-46047-5
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55. 
Cover image for CMOS Current-Mode Circuits for Data Communications
CMOS Current-Mode Circuits for Data Communications
Author 
Yuan, Fei. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-47691-9
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56. 
Cover image for Routing Congestion in VLSI Circuits: Estimation and Optimization
Routing Congestion in VLSI Circuits: Estimation and Optimization
Author 
Saxena, Prashant. author. Shelar, Rupesh S. author. Sapatnekar, Sachin S. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-48550-3
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57. 
Cover image for SAT-Based Scalable Formal Verification Solutions
SAT-Based Scalable Formal Verification Solutions
Author 
Ganai, Malay K. author. Gupta, Aarti. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-69167-1
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58. 
Cover image for Full-Chip Nanometer Routing Techniques
Full-Chip Nanometer Routing Techniques
Author 
Ho, Tsung-Yi. author. Chang, Yao-Wen. author. Chen, Sao-Jie. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-6195-0
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59. 
Cover image for Global Specification and Validation of Embedded Systems Integrating Heterogeneous Components
Global Specification and Validation of Embedded Systems Integrating Heterogeneous Components
Author 
Nicolescu, G. editor. Jerraya, A. A. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-6153-0
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60. 
Cover image for The Maintenance Management Framework Models and Methods for Complex Systems Maintenance
The Maintenance Management Framework Models and Methods for Complex Systems Maintenance
Author 
Márquez, Adolfo Crespo. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84628-821-0
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