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49. 
Cover image for Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Author 
Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.
Preferred Shelf Number 
ONLINE(342225.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414
ebrary http://site.ebrary.com/id/10881255
John Wiley http://dx.doi.org/10.1002/9783527681075
MyiLibrary http://www.myilibrary.com?id=615339
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50. 
Cover image for Handbook of 3D machine vision : optical metrology and imaging
Handbook of 3D machine vision : optical metrology and imaging
Author 
Song, Zhang.
Preferred Shelf Number 
TK8315 .H36 2013
Electronic Access 
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51. 
Cover image for Advances in mapping from remote sensor imagery : techniques and applications
Advances in mapping from remote sensor imagery : techniques and applications
Author 
Yang, Xiaojun. Li, Jonathan.
Preferred Shelf Number 
GA102.4 .R44 A38 2013
Electronic Access 
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52. 
Cover image for Photoacoustic imaging and spectroscopy
Photoacoustic imaging and spectroscopy
Author 
Wang, Lihong V.
Preferred Shelf Number 
TA1522 .P45 2009
Electronic Access 
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53. 
Cover image for Handbook of optical metrology : principles and applications
Handbook of optical metrology : principles and applications
Author 
Yoshizawa, Toru, 1939-
Preferred Shelf Number 
QC367 .H36 2009
Electronic Access 
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54. 
Cover image for Chromatic monitoring of complex conditions
Chromatic monitoring of complex conditions
Author 
Jones, G. R. (Gordon Rees), 1938- Deakin, Anthony G. Spencer, Joseph W.
Preferred Shelf Number 
QC793.3 .Q35 C57 2008
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55. 
Cover image for Imaging with synthetic aperture radar
Imaging with synthetic aperture radar
Author 
Massonnet, Didier., author. Souyris, Jean-Claude.
Preferred Shelf Number 
TK6592 .S95 M37 2008
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56. 
Cover image for Optical shop testing
Optical shop testing
Author 
Malacara, Daniel, 1937- Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470135976
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57. 
Cover image for Optical inspection of microsystems
Optical inspection of microsystems
Author 
Osten, Wolfgang.
Preferred Shelf Number 
TS156.2 .O652 2007
Electronic Access 
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58. 
Cover image for Lasers in the Preservation of Cultural Heritage : Principles and Applications.
Lasers in the Preservation of Cultural Heritage : Principles and Applications.
Author 
Fotakis, C. (Costas)
Preferred Shelf Number 
TA1675 .L392 2007 EB
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780367800857
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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59. 
Cover image for Interferogram analysis for optical testing
Interferogram analysis for optical testing
Author 
Malacara, Daniel, 1937- author. Malacara, Zacarias, 1948- Servin, Manuel.
Preferred Shelf Number 
QC367 .M25 2005
Electronic Access 
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60. 
Cover image for International Mining Forum : new technologies in underground mining safety in mines : proceedings of the Fifth International Mining Forum 2004, February 24-29, 2004, Cracow-Szczyrk-Wieliczka, Poland
International Mining Forum : new technologies in underground mining safety in mines : proceedings of the Fifth International Mining Forum 2004, February 24-29, 2004, Cracow-Szczyrk-Wieliczka, Poland
Author 
International Mining Forum (5th : 2004 : Krakow, Poland, etc.) Kicki, Jerzy. Sobczyk, Eugeniusz J.
Preferred Shelf Number 
TN295 .I624 2004
Electronic Access 
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