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49. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
Author 
Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-75728-5
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50. 
Cover image for Low-Power High-Level Synthesis for Nanoscale CMOS Circuits
Low-Power High-Level Synthesis for Nanoscale CMOS Circuits
Author 
Patra, Priyardarsan. author. Kougianos, Elias. author. Ranganathan, Nagarajan. author. Mohanty, Saraju P. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-76474-0
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51. 
Cover image for CMOS Active Inductors and Transformers Principle, Implementation, and Applications
CMOS Active Inductors and Transformers Principle, Implementation, and Applications
Author 
Yuan, Fei. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-76479-5
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52. 
Cover image for Field Models in Electricity and Magnetism
Field Models in Electricity and Magnetism
Author 
Barba, Paolo. author. Savini, Antonio. author. Wiak, Slawomir. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-6843-0
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53. 
Cover image for Large-Scale Scientific Computing 6th International Conference, LSSC 2007, Sozopol, Bulgaria, June 5-9, 2007. Revised Papers
Large-Scale Scientific Computing 6th International Conference, LSSC 2007, Sozopol, Bulgaria, June 5-9, 2007. Revised Papers
Author 
Lirkov, Ivan. editor. Margenov, Svetozar. editor. Waśniewski, Jerzy. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-78827-0
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54. 
Cover image for Dynamics of Microelectromechanical Systems
Dynamics of Microelectromechanical Systems
Author 
Lobontiu, Nicolae. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-68195-5
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55. 
Cover image for Closing the Power Gap Between ASIC & Custom Tools and Techniques for Low Power Design
Closing the Power Gap Between ASIC & Custom Tools and Techniques for Low Power Design
Author 
Chinnery, David. author. Keutzer, Kurt. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-68953-1
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56. 
Cover image for Verilog and SystemVerilog Gotchas 101 Common Coding Errors and How to Avoid Them
Verilog and SystemVerilog Gotchas 101 Common Coding Errors and How to Avoid Them
Author 
Sutherland, Stuart. author. Mills, Don. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-71715-9
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57. 
Cover image for Hardware Verification with SystemVerilog An Object-Oriented Framework
Hardware Verification with SystemVerilog An Object-Oriented Framework
Author 
Mintz, Mike. author. Ekendahl, Robert. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-71740-1
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58. 
Cover image for Full-Chip Nanometer Routing Techniques
Full-Chip Nanometer Routing Techniques
Author 
Ho, Tsung-Yi. author. Chang, Yao-Wen. author. Chen, Sao-Jie. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-6195-0
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59. 
Cover image for Model-Driven Architecture in Practice A Software Production Environment Based on Conceptual Modeling
Model-Driven Architecture in Practice A Software Production Environment Based on Conceptual Modeling
Author 
Pastor, Oscar. author. Molina, Juan Carlos. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-71868-0
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60. 
Cover image for Inverse Problems in Electric Circuits and Electromagnetics
Inverse Problems in Electric Circuits and Electromagnetics
Author 
Chechurin, V. L. author. Korovkin, N. V. author. Hayakawa, M. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-46047-5
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