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49. 
Cover image for Nanometer CMOS ICs From Basics to ASICs
Nanometer CMOS ICs From Basics to ASICs
Author 
J.M. Veendrick, Harry. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-47597-4
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50. 
Cover image for Hardware Security and Trust Design and Deployment of Integrated Circuits in a Threatened Environment
Hardware Security and Trust Design and Deployment of Integrated Circuits in a Threatened Environment
Author 
Sklavos, Nicolas. editor. Chaves, Ricardo. editor. Di Natale, Giorgio. editor. Regazzoni, Francesco. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-44318-8
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51. 
Cover image for Real-time embedded systems
Real-time embedded systems
Author 
Wang, Jiacun, 1963- author.
Preferred Shelf Number 
TK7895 .E42
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712
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52. 
Cover image for Nanoelectronics : materials, devices, applications
Nanoelectronics : materials, devices, applications
Author 
Puers, R., editor.
Preferred Shelf Number 
TK7874.84
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728
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53. 
Cover image for Fundamentals of Bias Temperature Instability in MOS Transistors Characterization Methods, Process and Materials Impact, DC and AC Modeling
Fundamentals of Bias Temperature Instability in MOS Transistors Characterization Methods, Process and Materials Impact, DC and AC Modeling
Author 
Mahapatra, Souvik. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-81-322-2508-9
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54. 
Cover image for Physics and Technology of Crystalline Oxide Semiconductor CAAC-IGZO : Application to Displays
Physics and Technology of Crystalline Oxide Semiconductor CAAC-IGZO : Application to Displays
Author 
Yamazaki, Shunpei, editor. Tsutsui, Tetsuo, editor.
Preferred Shelf Number 
TK7871.85
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119247395
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55. 
Cover image for Reliable Software for Unreliable Hardware A Cross Layer Perspective
Reliable Software for Unreliable Hardware A Cross Layer Perspective
Author 
Rehman, Semeen. author. Shafique, Muhammad. author. Henkel, Jörg. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-25772-3
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56. 
Cover image for Reliable Design of Electronic Equipment An Engineering Guide
Reliable Design of Electronic Equipment An Engineering Guide
Author 
Natarajan, Dhanasekharan. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-09111-2
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57. 
Cover image for Wafer-Level Chip-Scale Packaging Analog and Power Semiconductor Applications
Wafer-Level Chip-Scale Packaging Analog and Power Semiconductor Applications
Author 
Qu, Shichun. author. Liu, Yong. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4939-1556-9
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58. 
Cover image for CMOS Test and Evaluation A Physical Perspective
CMOS Test and Evaluation A Physical Perspective
Author 
Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4939-1349-7
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59. 
Cover image for Innovations and Advances in Computing, Informatics, Systems Sciences, Networking and Engineering
Innovations and Advances in Computing, Informatics, Systems Sciences, Networking and Engineering
Author 
Sobh, Tarek. editor. Elleithy, Khaled. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-06773-5
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60. 
Cover image for Bias Temperature Instability for Devices and Circuits
Bias Temperature Instability for Devices and Circuits
Author 
Grasser, Tibor. editor. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-1-4614-7909-3
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