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49. 
Cover image for CMOS sigma-delta converters practical design guide
CMOS sigma-delta converters practical design guide
Author 
Rosa, José M. de la. Río, R. del.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6497231
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50. 
Cover image for Fast Hopping Frequency Generation in Digital CMOS
Fast Hopping Frequency Generation in Digital CMOS
Author 
Farazian, Mohammad. author. Larson, Lawrence E. author. Gudem, Prasad S. author. SpringerLink (Online service)
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ONLINE(331241.1)
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http://dx.doi.org/10.1007/978-1-4614-0490-3
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51. 
Cover image for High-k gate dielectrics for CMOS technology
High-k gate dielectrics for CMOS technology
Author 
He, Gang (Professor of physics) Sun, Zhaoqi (Professor of physics)
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ONLINE
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ebrary An electronic book accessible through the World Wide Web; click to view
http://public.eblib.com/EBLPublic/PublicView.do?ptiID=956000
Wiley InterScience http://dx.doi.org/10.1002/9783527646340
ebrary http://site.ebrary.com/id/10653595
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52. 
Cover image for Integrated 60GHz RF Beamforming in CMOS
Integrated 60GHz RF Beamforming in CMOS
Author 
Yu, Yikun. author. Baltus, Peter G.M. author. van Roermund, Arthur H.M. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-94-007-0662-0
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53. 
Cover image for CMOS High Efficiency On-chip Power Management
CMOS High Efficiency On-chip Power Management
Author 
Hu, John. author. Ismail, Mohammed. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-9526-1
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54. 
Cover image for CMOS nanoelectronics analog and RF VLSI circuits
CMOS nanoelectronics analog and RF VLSI circuits
Author 
Iniewski, Krzysztof, 1960-
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ONLINE
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55. 
Cover image for Nanoscale CMOS VLSI circuits design for manufacturability
Nanoscale CMOS VLSI circuits design for manufacturability
Author 
Kundu, Sandip. Sreedhar, Aswin.
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56. 
Cover image for Nanometer CMOS RFICs for Mobile TV Applications
Nanometer CMOS RFICs for Mobile TV Applications
Author 
Youssef, Ahmed A. author. Haslett, James. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-8604-4
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57. 
Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Author 
Strong, Alvin Wayne, 1946-
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
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58. 
Cover image for Transient-induced latchup in CMOS integrated circuits
Transient-induced latchup in CMOS integrated circuits
Author 
Ker, Ming-Dou. Hsu, Sheng-Fu.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758
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59. 
Cover image for Tradeoffs and optimization in analog CMOS design
Tradeoffs and optimization in analog CMOS design
Author 
Binkley, David M. Wiley InterScience (Online service)
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John Wiley http://dx.doi.org/10.1002/9780470033715
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60. 
Cover image for Nanometer CMOS ICs : from basics to ASICs
Nanometer CMOS ICs : from basics to ASICs
Author 
Veendrick, H. J. M. (Harry J. M.)
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TK7871.99.M44 V45 2008
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