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1. 
Cover image for Automatic Generation of Combinatorial Test Data
Automatic Generation of Combinatorial Test Data
Author 
Zhang, Jian. author. Zhang, Zhiqiang. author. Ma, Feifei. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-662-43429-1
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2. 
Cover image for How to Reliably Test for GMOs
How to Reliably Test for GMOs
Author 
Žel, Jana. author. Milavec, Mojca. author. Morisset, Dany. author. Plan, Damien. author. Van den Eede, Guy. author.
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-1390-5
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3. 
Cover image for Microelectronic Test Structures for CMOS Technology
Microelectronic Test Structures for CMOS Technology
Author 
Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-9377-9
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4. 
Cover image for Usability testing essentials ready, set-- test
Usability testing essentials ready, set-- test
Author 
Barnum, Carol M.
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Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123750921
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5. 
Cover image for VMware certified professional test prep
VMware certified professional test prep
Author 
Ilgenfritz, Merle., author. Ilgenfritz, John. Powell, John. Baca, Steven.
Preferred Shelf Number 
QA76.3 .I56 2009
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6. 
Cover image for Statistical theories of mental test scores
Statistical theories of mental test scores
Author 
Lord, Frederic M. Novick, Melvin R. Birnbaum, Allan.
Preferred Shelf Number 
BF431 L59 2008
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7. 
Cover image for Test und Verlässlichkeit von Rechnern
Test und Verlässlichkeit von Rechnern
Author 
Kemnitz, Günter. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-71355-5
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8. 
Cover image for Fundamentals of Pap Test Cytology
Fundamentals of Pap Test Cytology
Author 
Hoda, Rana S. author. Hoda, Syed A. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-59745-276-2
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9. 
Cover image for Test and Analysis of Web Services
Test and Analysis of Web Services
Author 
Baresi, Luciano. editor. Nitto, Elisabetta Di. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-72912-9
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10. 
Cover image for Integrated Circuit Test Engineering Modern Techniques
Integrated Circuit Test Engineering Modern Techniques
Author 
Grout, Ian A. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-84628-173-3
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11. 
Cover image for Linear Models for Optimal Test Design
Linear Models for Optimal Test Design
Author 
Linden, Wim J. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-29054-0
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12. 
Cover image for The Kernel method of test equating
The Kernel method of test equating
Author 
Davier, Alina A. von. Holland, Paul W. Thayer, Dorothy T.
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ONLINE
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EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930
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