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49. 
Cover image for Hardware Accelerators in Data Centers
Hardware Accelerators in Data Centers
Author 
Kachris, Christoforos. editor. Falsafi, Babak. editor. Soudris, Dimitrios. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-92792-3
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50. 
Cover image for Architecture of Computing Systems – ARCS 2019 32nd International Conference, Copenhagen, Denmark, May 20–23, 2019, Proceedings
Architecture of Computing Systems – ARCS 2019 32nd International Conference, Copenhagen, Denmark, May 20–23, 2019, Proceedings
Author 
Schoeberl, Martin. editor. Hochberger, Christian. editor. Uhrig, Sascha. editor. Brehm, Jürgen. editor. Pionteck, Thilo. editor. (orcid)0000-0001-6518-1226
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https://doi.org/10.1007/978-3-030-18656-2
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51. 
Cover image for OpenSHMEM and Related Technologies. OpenSHMEM in the Era of Extreme Heterogeneity 5th Workshop, OpenSHMEM 2018, Baltimore, MD, USA, August 21–23, 2018, Revised Selected Papers
OpenSHMEM and Related Technologies. OpenSHMEM in the Era of Extreme Heterogeneity 5th Workshop, OpenSHMEM 2018, Baltimore, MD, USA, August 21–23, 2018, Revised Selected Papers
Author 
Pophale, Swaroop. editor. (orcid)0000-0001-8544-6367 Imam, Neena. editor. (orcid)0000-0001-8860-4738 Aderholdt, Ferrol. editor. (orcid)0000-0002-4208-6493 Gorentla Venkata, Manjunath. editor. (orcid)0000-0002-5282-1682 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-04918-8
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52. 
Cover image for Languages, Design Methods, and Tools for Electronic System Design Selected Contributions from FDL 2017
Languages, Design Methods, and Tools for Electronic System Design Selected Contributions from FDL 2017
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Große, Daniel. editor. Vinco, Sara. editor. Patel, Hiren. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-02215-0
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53. 
Cover image for Formal Verification of Floating-Point Hardware Design A Mathematical Approach
Formal Verification of Floating-Point Hardware Design A Mathematical Approach
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Russinoff, David M. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-95513-1
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54. 
Cover image for Computer Engineering and Technology 23rd CCF Conference, NCCET 2019, Enshi, China, August 1–2, 2019, Revised Selected Papers
Computer Engineering and Technology 23rd CCF Conference, NCCET 2019, Enshi, China, August 1–2, 2019, Revised Selected Papers
Author 
Xu, Weixia. editor. Xiao, Liquan. editor. Li, Jinwen. editor. Zhu, Zhenzhen. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-15-1850-8
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55. 
Cover image for RADIO--Robots in Assisted Living Unobtrusive, Efficient, Reliable and Modular Solutions for Independent Ageing
RADIO--Robots in Assisted Living Unobtrusive, Efficient, Reliable and Modular Solutions for Independent Ageing
Author 
Karkaletsis, Vangelis. editor. Konstantopoulos, Stasinos. editor. Voros, Nikolaos S. editor. Annicchiarico, Roberta. editor. Dagioglou, Maria. editor.
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https://doi.org/10.1007/978-3-319-92330-7
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56. 
Cover image for The Era of Internet of Things Towards a Smart World
The Era of Internet of Things Towards a Smart World
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Mohamed, Khaled Salah. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-18133-8
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57. 
Cover image for Complex Digital Circuits
Complex Digital Circuits
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Deschamps, Jean-Pierre. author. Valderrama, Elena. author. Terés, Lluís. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-12653-7
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58. 
Cover image for Design Automation Techniques for Approximation Circuits Verification, Synthesis and Test
Design Automation Techniques for Approximation Circuits Verification, Synthesis and Test
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Chandrasekharan, Arun. author. Große, Daniel. author. Drechsler, Rolf. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-98965-5
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59. 
Cover image for Modeling and Simulation of Invasive Applications and Architectures
Modeling and Simulation of Invasive Applications and Architectures
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Roloff, Sascha. author. Hannig, Frank. author. Teich, Jürgen. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-8387-8
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60. 
Cover image for Multi-run Memory Tests for Pattern Sensitive Faults
Multi-run Memory Tests for Pattern Sensitive Faults
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Mrozek, Ireneusz. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-91204-2
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