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49. 
Cover image for Reliability Engineering Theory and Practice
Reliability Engineering Theory and Practice
Author 
Birolini, Alessandro. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-642-39535-2
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50. 
Cover image for Electricity infrastructure reliability and vulnerabilities
Electricity infrastructure reliability and vulnerabilities
Author 
Guerritore, Walter B.
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EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180
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51. 
Cover image for Computer system reliability safety and usability
Computer system reliability safety and usability
Author 
Dhillon, B. S.
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52. 
Cover image for Reliability models for engineers and scientists
Reliability models for engineers and scientists
Author 
Kaminskiy, Mark, 1946-
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53. 
Cover image for Analog IC Reliability in Nanometer CMOS
Analog IC Reliability in Nanometer CMOS
Author 
Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)
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ONLINE(331961.1)
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http://dx.doi.org/10.1007/978-1-4614-6163-0
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54. 
Cover image for Reliability and maintenance networks and systems
Reliability and maintenance networks and systems
Author 
Beichelt, Frank, 1942- Tittmann, Peter.
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55. 
Cover image for Semiconductor packaging materials interaction and reliability
Semiconductor packaging materials interaction and reliability
Author 
Chen, Andrea. Lo, Randy.
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56. 
Cover image for Semiconductor process reliability in practice
Semiconductor process reliability in practice
Author 
Gan, Zhenghao. Wong, Waisum. Liou, Juin J.
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57. 
Cover image for Lead Free Solder Mechanics and Reliability
Lead Free Solder Mechanics and Reliability
Author 
Pang, John Hock Lye. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-0463-7
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58. 
Cover image for Accelerated reliability and durability testing technology
Accelerated reliability and durability testing technology
Author 
Klyatis, Lev M.
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
ebrary http://site.ebrary.com/id/10592157
http://swb.eblib.com/patron/FullRecord.aspx?p=693204
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59. 
Cover image for Functional Analysis Methods for Reliability Models
Functional Analysis Methods for Reliability Models
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Gupur, Geni. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-0348-0101-0
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60. 
Cover image for Semiconductor Power Devices Physics, Characteristics, Reliability
Semiconductor Power Devices Physics, Characteristics, Reliability
Author 
Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-11125-9
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