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1. 
Cover image for Handbook of Measurement Error Models.
Handbook of Measurement Error Models.
Author 
Yi, Grace Y. Delaigle, Aurore. Gustafson, Paul
Preferred Shelf Number 
QA275
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781315101279
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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2. 
Cover image for Ice adhesion : mechanism, measurement and mitigation
Ice adhesion : mechanism, measurement and mitigation
Author 
Mittal, K. L., 1945- editor. Choi, Chang-Hwan, 1973- editor.
Preferred Shelf Number 
TA714.5 .I23 2020 EB
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119640523
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3. 
Cover image for Depressive Disorders: Mechanisms, Measurement and Management
Depressive Disorders: Mechanisms, Measurement and Management
Author 
Fang, Yiru. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-32-9271-0
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4. 
Cover image for Measurement in Machining and Tribology
Measurement in Machining and Tribology
Author 
Davim, J. Paulo. editor. (orcid)0000-0002-5659-3111 SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-03822-9
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5. 
Cover image for Contactless VLSI Measurement and Testing Techniques
Contactless VLSI Measurement and Testing Techniques
Author 
Sayil, Selahattin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-69673-7
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6. 
Cover image for Thermal properties measurement of materials
Thermal properties measurement of materials
Author 
Jannot, Yves, author. Degiovanni, Alain, author.
Preferred Shelf Number 
TA418.24
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119475057
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7. 
Cover image for OPTICAL METHODS OF MEASUREMENT : wholefield techniques.
OPTICAL METHODS OF MEASUREMENT : wholefield techniques.
Author 
SIROHI, RAJPAL.
Preferred Shelf Number 
QC367
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781315221359
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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8. 
Cover image for Measurement technology for micro-nanometer devices
Measurement technology for micro-nanometer devices
Author 
Zhang, Wendong, author.
Preferred Shelf Number 
TA418.9 .N35
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781118717974
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9. 
Cover image for Measurement, instrumentation, and sensors handbook
Measurement, instrumentation, and sensors handbook
Author 
Eren, Halit (Professor of electrical engineering), editor. Webster, John G., 1932- editor.
Preferred Shelf Number 
QC39 .M393 2014
Electronic Access 
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10. 
Cover image for Adhesion measurement of films and coatings
Adhesion measurement of films and coatings
Author 
Mittal, Kash L., 1945- editor. Taylor and Francis.
Preferred Shelf Number 
QC183
Electronic Access 
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11. 
Cover image for Linear Systems A Measurement Based Approach
Linear Systems A Measurement Based Approach
Author 
Bhattacharyya, S. P. author. Keel, L.H. author. Mohsenizadeh, D.N. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-81-322-1641-4
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12. 
Cover image for Measurement, instrumentation, and sensors handbook
Measurement, instrumentation, and sensors handbook
Author 
Webster, John G., 1932- editor. Eren, Halit (Professor of electrical engineering), editor.
Preferred Shelf Number 
QC39 .M393 2014
Electronic Access 
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