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1. 
Cover image for A practical guide to optical metrology for thin films
A practical guide to optical metrology for thin films
Author 
Quinten, Michael.
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ONLINE
Electronic Access 
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John Wiley http://dx.doi.org/10.1002/9783527664344
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2. 
Cover image for Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
Author 
Proulx, Tom. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0228-2
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3. 
Cover image for The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
Author 
Hebra, Alexius J. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-211-78381-8
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4. 
Cover image for Data Modeling for Metrology and Testing in Measurement Science
Data Modeling for Metrology and Testing in Measurement Science
Author 
Pavese, Franco. editor. Forbes, Alistair B. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-8176-4804-6
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5. 
Cover image for Fringe 2009 6th International Workshop on Advanced Optical Metrology
Fringe 2009 6th International Workshop on Advanced Optical Metrology
Author 
Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-03051-2
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6. 
Cover image for Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal
Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal
Author 
Meinrath, G. author. Schneider, Petra. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-71273-2
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7. 
Cover image for Microwave Circuit Theory and Foundations of Microwave Metrology
Microwave Circuit Theory and Foundations of Microwave Metrology
Author 
Engen, Glenn F.
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ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBEL009E
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8. 
Cover image for Handbook of surface and nanometrology
Handbook of surface and nanometrology
Author 
Whitehouse, D. J. (David J.), author. Whitehouse, D. J. (David J.). Handbook of surface metrology.
Preferred Shelf Number 
TA418.7 .W47 2011
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9. 
Cover image for Handbook of surface and nanometrology
Handbook of surface and nanometrology
Author 
Whitehouse, D. J. (David J.), author. Whitehouse, D. J. (David J.). Handbook of surface metrology.
Preferred Shelf Number 
TA418.7 .W45 2003
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10. 
Cover image for Accuracy and Calibration Failures in Science and Engineering.
Accuracy and Calibration Failures in Science and Engineering.
Author 
Holloway, Michael D.
Preferred Shelf Number 
TA165
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394417056
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11. 
Cover image for Psychometrics, Test Theory, and the Latent Factors Model.
Psychometrics, Test Theory, and the Latent Factors Model.
Author 
Blahus, Pet. Blahus, Petr/Brown, Bruce L. Bunderson, C. Victor.
Preferred Shelf Number 
XX(600387.1)
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119312246
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12. 
Cover image for Computer vision & laser vibrometry. Volume 6
Computer vision & laser vibrometry. Volume 6
Author 
International Modal Analysis Conference (41st : 2023) Baqersad, Javad, editor. Di Maio, Dario, editor.
Preferred Shelf Number 
TA1634 .I58 2023 EB
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9788743804123
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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