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49. 
Cover image for Ternary Networks Reliability and Monte Carlo
Ternary Networks Reliability and Monte Carlo
Author 
Gertsbakh, Ilya. author. Shpungin, Yoseph. author. Vaisman, Radislav. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-06440-6
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50. 
Cover image for Reliability Engineering Theory and Practice
Reliability Engineering Theory and Practice
Author 
Birolini, Alessandro. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-642-39535-2
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51. 
Cover image for Electricity infrastructure reliability and vulnerabilities
Electricity infrastructure reliability and vulnerabilities
Author 
Guerritore, Walter B.
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ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180
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52. 
Cover image for Reliability models for engineers and scientists
Reliability models for engineers and scientists
Author 
Kaminskiy, Mark, 1946-
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53. 
Cover image for Computer system reliability safety and usability
Computer system reliability safety and usability
Author 
Dhillon, B. S.
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54. 
Cover image for Analog IC Reliability in Nanometer CMOS
Analog IC Reliability in Nanometer CMOS
Author 
Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)
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ONLINE(331961.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-6163-0
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55. 
Cover image for Lead Free Solder Mechanics and Reliability
Lead Free Solder Mechanics and Reliability
Author 
Pang, John Hock Lye. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-0463-7
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56. 
Cover image for Reliability and availability of cloud computing
Reliability and availability of cloud computing
Author 
Bauer, Eric. Adams, Randee. Wiley InterScience (Online service)
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788
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57. 
Cover image for Semiconductor packaging materials interaction and reliability
Semiconductor packaging materials interaction and reliability
Author 
Chen, Andrea. Lo, Randy.
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58. 
Cover image for Reliability and maintenance networks and systems
Reliability and maintenance networks and systems
Author 
Beichelt, Frank, 1942- Tittmann, Peter.
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59. 
Cover image for Semiconductor process reliability in practice
Semiconductor process reliability in practice
Author 
Gan, Zhenghao. Wong, Waisum. Liou, Juin J.
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60. 
Cover image for Accelerated reliability and durability testing technology
Accelerated reliability and durability testing technology
Author 
Klyatis, Lev M.
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ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
ebrary http://site.ebrary.com/id/10592157
http://swb.eblib.com/patron/FullRecord.aspx?p=693204
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