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1. 
Cover image for Semiconductor Power Devices Physics, Characteristics, Reliability
Semiconductor Power Devices Physics, Characteristics, Reliability
Author 
Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-70917-8
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2. 
Cover image for Reliability Aspect of Cloud Computing Environment
Reliability Aspect of Cloud Computing Environment
Author 
Kumar, Vikas. author. Vidhyalakshmi, R. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-3023-0
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3. 
Cover image for In-Service Fatigue Reliability of Structures
In-Service Fatigue Reliability of Structures
Author 
Petinov, Sergei V. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-89318-1
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4. 
Cover image for Wire Ropes Tension, Endurance, Reliability
Wire Ropes Tension, Endurance, Reliability
Author 
Feyrer, Klaus. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-642-54996-0
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5. 
Cover image for Ternary Networks Reliability and Monte Carlo
Ternary Networks Reliability and Monte Carlo
Author 
Gertsbakh, Ilya. author. Shpungin, Yoseph. author. Vaisman, Radislav. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-06440-6
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6. 
Cover image for Reliability of large and complex systems
Reliability of large and complex systems
Author 
Kołowrocki, Krzysztof, author.
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ONLINE(355886.1)
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ScienceDirect http://www.sciencedirect.com/science/book/9780080999494
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7. 
Cover image for Reliability Engineering Theory and Practice
Reliability Engineering Theory and Practice
Author 
Birolini, Alessandro. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-642-39535-2
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8. 
Cover image for Reliability models for engineers and scientists
Reliability models for engineers and scientists
Author 
Kaminskiy, Mark, 1946-
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9. 
Cover image for Electricity infrastructure reliability and vulnerabilities
Electricity infrastructure reliability and vulnerabilities
Author 
Guerritore, Walter B.
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ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180
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10. 
Cover image for Computer system reliability safety and usability
Computer system reliability safety and usability
Author 
Dhillon, B. S.
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11. 
Cover image for Analog IC Reliability in Nanometer CMOS
Analog IC Reliability in Nanometer CMOS
Author 
Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)
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ONLINE(331961.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-6163-0
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12. 
Cover image for Lead Free Solder Mechanics and Reliability
Lead Free Solder Mechanics and Reliability
Author 
Pang, John Hock Lye. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-0463-7
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