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49. 
Cover image for AmIware Hardware Technology Drivers of Ambient Intelligence
AmIware Hardware Technology Drivers of Ambient Intelligence
Author 
Mukherjee, Satyen. editor. Aarts, Ronald M. editor. Roovers, Raf. editor. Widdershoven, Frans. editor. Ouwerkerk, Martin. editor.
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-4198-5
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50. 
Cover image for Functional Properties of Nanostructured Materials
Functional Properties of Nanostructured Materials
Author 
Kassing, Rainer. editor. Petkov, Plamen. editor. Kulisch, Wilhelm. editor. Popov, Cyril. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/1-4020-4594-8
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51. 
Cover image for Surface Chemistry in Biomedical and Environmental Science
Surface Chemistry in Biomedical and Environmental Science
Author 
Blitz, Jonathan P. editor. Gun'ko, Vladimir M. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/1-4020-4741-X
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52. 
Cover image for New Carbon Based Materials for Electrochemical Energy Storage Systems: Batteries, Supercapacitors and Fuel Cells
New Carbon Based Materials for Electrochemical Energy Storage Systems: Batteries, Supercapacitors and Fuel Cells
Author 
Barsukov, Igor V. editor. Johnson, Christopher S. editor. Doninger, Joseph E. editor. Barsukov, Vyacheslav Z. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/1-4020-4812-2
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53. 
Cover image for Radio Design in Nanometer Technologies
Radio Design in Nanometer Technologies
Author 
ISMAIL, MOHAMMED. editor. GONZÁLEZ, DELIA RODRÍGUEZ DE LLERA. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-1-4020-4824-1
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54. 
Cover image for Nanoscale Devices - Fundamentals and Applications
Nanoscale Devices - Fundamentals and Applications
Author 
Gross, Rudolf. editor. Sidorenko, Anatolie. editor. Tagirov, Lenar. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-1-4020-5107-4
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55. 
Cover image for PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGY
PRECISION TEMPERATURE SENSORS IN CMOS TECHNOLOGY
Author 
Pertijs, Michiel A.P. author. Huijsing, Johan H. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/1-4020-5258-8
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56. 
Cover image for Applied Scanning Probe Methods III Characterization
Applied Scanning Probe Methods III Characterization
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/b138285
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57. 
Cover image for Applied Scanning Probe Methods IV Industrial Applications
Applied Scanning Probe Methods IV Industrial Applications
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138289
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58. 
Cover image for Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces
Author 
Kaupp, Gerd. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-3-540-28472-7
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59. 
Cover image for Introduction to Wave Scattering, Localization and Mesoscopic Phenomena
Introduction to Wave Scattering, Localization and Mesoscopic Phenomena
Author 
Ping, Sheng. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-29156-3
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60. 
Cover image for Redox Systems Under Nano-Space Control
Redox Systems Under Nano-Space Control
Author 
Hirao, Toshikazu. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-29580-1
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