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49. 
Cover image for CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms
CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms
Author 
Li, Flora M. author. Nathan, Arokia. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b139047
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50. 
Cover image for Multilayered Low Temperature Cofired Ceramics (LTCC) Technology
Multilayered Low Temperature Cofired Ceramics (LTCC) Technology
Author 
Imanaka, Yoshihiko. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b101196
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51. 
Cover image for Electroceramic-Based MEMS Fabrication-Technology and Applications
Electroceramic-Based MEMS Fabrication-Technology and Applications
Author 
Setter, Nava. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b101200
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52. 
Cover image for Modern Techniques for Characterizing Magnetic Materials
Modern Techniques for Characterizing Magnetic Materials
Author 
Zhu, Yimei. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b101202
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53. 
Cover image for Nanotribology and Nanomechanics An Introduction
Nanotribology and Nanomechanics An Introduction
Author 
Bhushan, Bharat. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-28248-3
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54. 
Cover image for Microcontrollers in Practice
Microcontrollers in Practice
Author 
Mitescu, Marian. author. Susnea, Ioan. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-28308-0
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55. 
Cover image for Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Author 
Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-31915-8
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