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1. 
Cover image for Power Distribution Networks with On-Chip Decoupling Capacitors
Power Distribution Networks with On-Chip Decoupling Capacitors
Author 
Popovich, Mikhhail. author. Mezhiba, Andrey V. author. Friedman, Eby G. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-71601-5
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2. 
Cover image for Rapid Prototyping of Digital Systems
Rapid Prototyping of Digital Systems
Author 
Hamblen, James O. author. Hall, Tyson S. author. Furman, Michael D. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-72671-7
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3. 
Cover image for Adaptive Techniques for Dynamic Processor Optimization Theory and Practice
Adaptive Techniques for Dynamic Processor Optimization Theory and Practice
Author 
Wang, Alice. editor. Naffziger, Samuel. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-76472-6
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4. 
Cover image for Low-Power High-Level Synthesis for Nanoscale CMOS Circuits
Low-Power High-Level Synthesis for Nanoscale CMOS Circuits
Author 
Patra, Priyardarsan. author. Kougianos, Elias. author. Ranganathan, Nagarajan. author. Mohanty, Saraju P. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-76474-0
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5. 
Cover image for CMOS Active Inductors and Transformers Principle, Implementation, and Applications
CMOS Active Inductors and Transformers Principle, Implementation, and Applications
Author 
Yuan, Fei. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-76479-5
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6. 
Cover image for System Verilog for Verification A Guide to Learning the Testbench Language Features
System Verilog for Verification A Guide to Learning the Testbench Language Features
Author 
Spear, Chris. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-76530-3
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7. 
Cover image for Nanometer CMOS ICs From basics to ASICs
Nanometer CMOS ICs From basics to ASICs
Author 
Veendrick, H. J. M. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8333-4
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8. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-74747-7
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9. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
Author 
Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-75728-5
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10. 
Cover image for Handbuch für die Pogrammierung mit LabVIEW mit Studentenversion LabVIEW 8
Handbuch für die Pogrammierung mit LabVIEW mit Studentenversion LabVIEW 8
Author 
Mütterlein, Bernward. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-8274-2338-2
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11. 
Cover image for Metric- Driven Design Verification An Engineer's and Executive's Guide to First Pass Success
Metric- Driven Design Verification An Engineer's and Executive's Guide to First Pass Success
Author 
Carter, Hamilton B. author. Hemmady, Shankar. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-38152-7
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12. 
Cover image for Power-Aware Architecting for data-dominated applications
Power-Aware Architecting for data-dominated applications
Author 
Ditzel, Maarten. author. Otten, Ralph H. J. M. author. Serdijn, Wouter A. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-6420-3
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