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Subject: Reliability (Engineering)

Author

Wiley InterScience (Online service)

(10)

Bayle, Franck, author.

(3)

Delaux, David, editor.

(3)

El Hami, Abdelkhalak, editor.

(3)

Grzeskowiak, Henri, editor.

(3)

(2)

Curtis, Peter M., author.

(2)

(2)

Ushakov, I. A. (Igorʹ Alekseevich)

(2)

Allocco, Michael.

(1)

Amiri, Mehdi, author.

(1)

Bahret, Adam P., 1973- author.

(1)

Beck, André T., author.

(1)

Bergman, Bo, 1943-

(1)

Blischke, W. R., 1934-

(1)

Bolia, Nomesh, author.

(1)

Chaturvedi, Sanjay K., author.

(1)

Chaturvedi, Sanjay K., editor.

(1)

Curtis, Peter M.

(1)

(1)

Dodson, Bryan, 1962- author.

(1)

El Hami, Abdelkhalak, author.

(1)

El Hami, Abdelkhalak.

(1)

Elsayed, Elsayed A., author.

(1)

(1)

Gacula, Maximo C.

(1)

Gargama, Heeralal, editor.

(1)

Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.

(1)

Grous, Ammar, author.

(1)

Grzeskowiak, Henri.

(1)

Gullo, Louis J.

(1)

Gunawan, Indra.

(1)

Hammett, Patrick C., author.

(1)

Harrison, Robert A.

(1)

Hwang, Jaejin, author.

(1)

IEEE Xplore (Online Service), distributor.

(1)

Jackson, Christopher, 1979- author.

(1)

Jackson, Scott, author.

(1)

Jackson, Scott.

(1)

Jin, Tongdan, author.

(1)

John Wiley & Sons.

(1)

(1)

Kalal, Ted T., author.

(1)

Kapur, Kailash C., 1941- author.

(1)

Kimber, Douglas A.

(1)

Klerx, Rene, author.

(1)

Kleyner, Andre.

(1)

Klyatis, Lev M.

(1)

Kuo, Way, 1951-

(1)

Lemaire, Maurice.

(1)

Leroy, Alain, author.

(1)

Levin, Mark, 1959-

(1)

Levin, Mark, 1959- author.

(1)

Levitin, Gregory, author.

(1)

Lewis, Ted G., author

(1)

Li, Yan-Fu, author.

(1)

Limnios, N. (Nikolaos)

(1)

Malik, S. C., editor.

(1)

Melchers, R. E. (Robert E.), 1945- author.

(1)

Modarres, M. (Mohammad), author.

(1)

Moskowitz, Howard R.

(1)

Murthy, D. N. P.

(1)

Muñoz, Alejandra M., 1957-

(1)

Natvig, Bent, 1946-

(1)

Nelson, Wayne, 1936-

(1)

O'Connor, Patrick P.

(1)

Pecht, Michael, author.

(1)

Radi, Bouchaïb, author.

(1)

Rai, Rajiv N., editor.

(1)

Rai, Rajiv Nandan, author.

(1)

Ranganathan, Subramanyam.

(1)

Rausand, Marvin.

(1)

Rodin, Jonathan, 1957- author.

(1)

Saket, R. K., editor.

(1)

Sanjeevikumar, Padmanaban, 1978-

(1)

Tacchini, Marco, author.

(1)

Taylor, Zachary, 1959-

(1)

Todinov, M. T., author.

(1)

Wang, Chaonan, 1986- author.

(1)

Wiley, publisher.

(1)

Wohlgemuth, J. (John), 1946- author.

(1)

Xing, Liudong, author.

(1)

Yang, Guangbin, 1964-

(1)

(1)

(1)

Zio, Enrico, author.

(1)

Language

(51)

Publication Date

-

(6)

(5)

(4)

(4)

(3)

(3)

(3)

(3)

(3)

(3)

(2)

(2)

(2)

(2)

(2)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Subject

(27)

Electronic books.

(25)

TECHNOLOGY & ENGINEERING.

(10)

TECHNOLOGY & ENGINEERING -- Engineering (General)

(7)

TECHNOLOGY & ENGINEERING -- Reference.

(7)

Quality Control.

(4)

Systems engineering.

(4)

Industrial Engineering.

(3)

Industrial safety.

(3)

Ingénierie des systèmes.

(3)

System analysis

(3)

Analyse de systèmes.

(2)

(2)

Industrial design.

(2)

(2)

(2)

Quality control.

(2)

(2)

Six sigma (Quality control standard)

(2)

System analysis.

(2)

System failures (Engineering)

(2)

(2)

Systems Analysis

(2)

Systems engineering

(2)

Sécurité du travail.

(2)

TECHNOLOGY & ENGINEERING / Quality Control

(2)

occupational safety.

(2)

systems analysis.

(2)

Accelerated life testing.

(1)

Analyse des défaillances (Ingénierie)

(1)

Cellules photovoltaïques.

(1)

Commercial products -- Sensory evaluation.

(1)

Computational intelligence

(1)

Computational intelligence.

(1)

Computer programs -- Evaluation.

(1)

Computer software -- Evaluation

(1)

Computer software -- Evaluation.

(1)

Conception technique.

(1)

Constructions -- Stabilité.

(1)

Corporate culture

(1)

Corporate culture.

(1)

Culture organisationnelle.

(1)

Développement durable.

(1)

Electric power systems.

(1)

(1)

Engineering design.

(1)

Engineering inspection.

(1)

Fabrication -- Informatique.

(1)

Failure analysis (Engineering)

(1)

Finite element method.

(1)

Fracture Mechanics.

(1)

Gestion du risque.

(1)

Industrial design -- Statistical methods.

(1)

Industrial priorities.

(1)

Industrial safety

(1)

Intelligence informatique.

(1)

Interconnects (Integrated circuit technology)

(1)

(1)

(1)

Logiciels -- Évaluation.

(1)

(1)

Machinery -- Safety regulations.

(1)

Machinery -- Standards

(1)

Machinery -- Standards.

(1)

Machines -- Normes.

(1)

Maintainability (Engineering)

(1)

Manufacturing processes -- Data processing

(1)

Manufacturing processes -- Data processing.

(1)

(1)

Mechanical wear

(1)

Mechanical wear.

(1)

(1)

(1)

(1)

Multidisciplinary design optimization

(1)

Méthode des éléments finis.

(1)

Occupational Health

(1)

Photovoltaic cells

(1)

Photovoltaic cells.

(1)

(1)

(1)

(1)

Product life cycle.

(1)

Python (Computer program language)

(1)

Python (Langage de programmation)

(1)

Quality assurance.

(1)

Quality control

(1)

Qualité -- Contrôle.

(1)

Risk assessment.

(1)

Risk management

(1)

Risk management.

(1)

Robust statistics.

(1)

Réseaux électriques (Énergie)

(1)

SCIENCE -- Energy.

(1)

Safety factor in engineering

(1)

Safety regulations

(1)

(1)

Stochastic systems.

(1)

Structural engineering -- Mathematics.

(1)

Structural failures.

(1)

Structural stability

(1)

Structural stability.

(1)

Sustainable development

(1)

Sustainable development.

(1)

Sustainable engineering

(1)

Systems engineering -- Case studies.

(1)

Sécurité des systèmes.

(1)

TECHNOLOGY & ENGINEERING -- Civil -- General.

(1)

TECHNOLOGY & ENGINEERING -- Electrical.

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- General.

(1)

TECHNOLOGY & ENGINEERING -- Quality Control.

(1)

Trees (Graph theory)

(1)

Usure (Mécanique)

(1)

(1)

(1)

Material Type

Shelf Location

Electronic Library

Wiley E-Book Collection

Library

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49.

Cover image for Reliability of safety-critical systems : theory and application

Reliability of safety-critical systems : theory and application

Reliability of safety-critical systems : theory and application

Author

Rausand, Marvin.

Preferred Shelf Number

ONLINE(341773.1)

Electronic Access

Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653
John Wiley http://dx.doi.org/10.1002/9781118776353

Format:

Availability

Online Library~1

Available:
Copies:

50.

Cover image for Fracture mechanics. 1, Analysis of reliability and quality control

Fracture mechanics. 1, Analysis of reliability and quality control

Fracture mechanics. 1, Analysis of reliability and quality control

Author

Grous, Ammar, author.

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9781118580004
Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118580004

Format:

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Online Library~1

Available:
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51.

Cover image for Importance measures in reliability, risk, and optimization principles and applications

Importance measures in reliability, risk, and optimization principles and applications

Importance measures in reliability, risk, and optimization principles and applications

Author

Kuo, Way, 1951- Zhu, Xiaoyan.

Preferred Shelf Number

ONLINE

Electronic Access

Available by subscription from Safari Books Online
Cover image http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160
John Wiley http://dx.doi.org/10.1002/9781118314593
http://site.ebrary.com/lib/alltitles/Doc?id=10559415

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52.

Cover image for Design for reliability information and computer-based systems

Design for reliability information and computer-based systems

Design for reliability information and computer-based systems

Author

Bauer, Eric.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779

Format:

Availability

Online Library~1

Available:
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53.

Cover image for Practical system reliability

Practical system reliability

Practical system reliability

Author

Bauer, Eric. Zhang, Xuemei. Kimber, Douglas A.

Preferred Shelf Number

ONLINE

Electronic Access

EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294

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Online Library~1

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54.

Cover image for Maintaining mission critical systems in a 24/7 environment

Maintaining mission critical systems in a 24/7 environment

Maintaining mission critical systems in a 24/7 environment

Author

Curtis, Peter M.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749

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Online Library~1

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55.

Cover image for Assurance technologies principles and practices : a product, process, and system safety perspective

Assurance technologies principles and practices : a product, process, and system safety perspective

Assurance technologies principles and practices : a product, process, and system safety perspective

Author

Raheja, Dev. Allocco, Michael.

Preferred Shelf Number

ONLINE

Electronic Access

MyiLibrary, Table of contents http://www.myilibrary.com?id=54979&ref=toc
John Wiley http://dx.doi.org/10.1002/047000942X
http://www3.interscience.wiley.com/cgi-bin/bookhome/112151853
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/62326785.html

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