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49. 
Cover image for Semiconductor memories technology, testing, and reliability
Semiconductor memories technology, testing, and reliability
Author 
Sharma, Ashok K. IEEE Solid-State Circuits Council.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189
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50. 
Cover image for Standard for use of the International System of Units (SI) : the modern metric system
Standard for use of the International System of Units (SI) : the modern metric system
Author 
American Society for Testing and Materials.
Preferred Shelf Number 
QC91 S82 1997
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51. 
Cover image for Electromagnetic waves and stratified media
Electromagnetic waves and stratified media
Author 
Wait, James R.
Preferred Shelf Number 
QC 973 W33 1996
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52. 
Cover image for Understanding neural networks and fuzzy logic basic concepts and applications
Understanding neural networks and fuzzy logic basic concepts and applications
Author 
Kartalopoulos, Stamatios V. IEEE Neural Networks Council.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273099
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53. 
Cover image for Understanding electro-mechanical engineering an introduction to mechatronics
Understanding electro-mechanical engineering an introduction to mechatronics
Author 
Kamm, Lawrence J.
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ONLINE
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273061
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54. 
Cover image for The plane wave spectrum representation of electromagnetic fields
The plane wave spectrum representation of electromagnetic fields
Author 
Clemmow, P. C. IEEE Antennas and Propagation Society.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732786
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55. 
Cover image for The transmission-line modeling method : TLM
The transmission-line modeling method : TLM
Author 
Christopoulos, Christos.
Preferred Shelf Number 
TK 7876 C57 1995
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56. 
Cover image for Singular electromagnetic fields and sources
Singular electromagnetic fields and sources
Author 
Bladel, Jean van, 1922-
Preferred Shelf Number 
QC 665.E4 B574 1991
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57. 
Cover image for The transmission-line modeling method TLM
The transmission-line modeling method TLM
Author 
Christopoulos, Christos.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273048
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58. 
Cover image for Microstrip antennas the analysis and design of microstrip antennas and arrays
Microstrip antennas the analysis and design of microstrip antennas and arrays
Author 
Pozar, David M. Schaubert, D. IEEE Antennas and Propagation Society.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263382
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59. 
Cover image for Electrical power systems design and analysis
Electrical power systems design and analysis
Author 
El-Hawary, M. E.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266298
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60. 
Cover image for Routing in the third dimension from VLSI chips to MCMs
Routing in the third dimension from VLSI chips to MCMs
Author 
Sherwani, N. A. (Naveed A.) Bhingarde, Siddharth. Panyam, Anand.
Preferred Shelf Number 
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Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263943
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