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1. 
Cover image for Metrology and standardization of nanotechnology : protocols and industrial innovations
Metrology and standardization of nanotechnology : protocols and industrial innovations
Author 
Mansfield, Elisabeth, (Research chemist), editor. Kaiser, Debra L., editor. Fujita, Daisuke (Materials scientist), editor. Voorde, M. H. van de (Marcel H.), editor.
Preferred Shelf Number 
T174.7
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308
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2. 
Cover image for Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists
Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists
Author 
Vosk, Ted, author. Emery, A. F. (Ashley Francis), 1934- author.
Preferred Shelf Number 
HV8073.5 .V67 2015
Electronic Access 
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3. 
Cover image for Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Author 
Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.
Preferred Shelf Number 
ONLINE(342225.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414
ebrary http://site.ebrary.com/id/10881255
John Wiley http://dx.doi.org/10.1002/9783527681075
MyiLibrary http://www.myilibrary.com?id=615339
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4. 
Cover image for Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
Author 
Osten, Wolfgang. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-642-36359-7
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5. 
Cover image for Performance-based gear metrology kinematic-transmission-error computation and diagnosis
Performance-based gear metrology kinematic-transmission-error computation and diagnosis
Author 
Mark, William D.
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ONLINE
Electronic Access 
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John Wiley http://dx.doi.org/10.1002/9781118357903
Books24x7 http://www.books24x7.com/marc.asp?bookid=51229
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6. 
Cover image for Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
Author 
Boutier, A. (Alain)
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ONLINE
Electronic Access 
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Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118576847
John Wiley http://dx.doi.org/10.1002/9781118576847
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7. 
Cover image for Handbook of 3D machine vision : optical metrology and imaging
Handbook of 3D machine vision : optical metrology and imaging
Author 
Song, Zhang.
Preferred Shelf Number 
TK8315 .H36 2013
Electronic Access 
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8. 
Cover image for A practical guide to optical metrology for thin films
A practical guide to optical metrology for thin films
Author 
Quinten, Michael.
Preferred Shelf Number 
ONLINE
Electronic Access 
Check for Full Text Access restricted: MSVU users only
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John Wiley http://dx.doi.org/10.1002/9783527664344
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9. 
Cover image for Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
Author 
Proulx, Tom. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0228-2
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10. 
Cover image for The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
Author 
Hebra, Alexius J. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-211-78381-8
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11. 
Cover image for Fringe 2009 6th International Workshop on Advanced Optical Metrology
Fringe 2009 6th International Workshop on Advanced Optical Metrology
Author 
Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-03051-2
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12. 
Cover image for Data Modeling for Metrology and Testing in Measurement Science
Data Modeling for Metrology and Testing in Measurement Science
Author 
Pavese, Franco. editor. Forbes, Alistair B. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-8176-4804-6
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