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1. 
Cover image for Experimental and Applied Mechanics, Volume 6 Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics
Experimental and Applied Mechanics, Volume 6 Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics
Author 
Sottos, Nancy. editor. Rowlands, Robert. editor. Dannemann, Kathryn. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-06989-0
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2. 
Cover image for Nanoscience Advances in CBRN Agents Detection, Information and Energy Security
Nanoscience Advances in CBRN Agents Detection, Information and Energy Security
Author 
Petkov, Plamen. editor. Tsiulyanu, Dumitru. editor. Kulisch, Wilhelm. editor. Popov, Cyril. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-94-017-9697-2
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3. 
Cover image for Phase estimation in optical interferometry
Phase estimation in optical interferometry
Author 
Rastogi, Pramod K., 1951- editor. Hack, Erwin, editor.
Preferred Shelf Number 
QC367 .P43 2015
Electronic Access 
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4. 
Cover image for Advancement of Optical Methods in Experimental Mechanics, Volume 3 Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics
Advancement of Optical Methods in Experimental Mechanics, Volume 3 Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics
Author 
Jin, Helena. editor. Sciammarella, Cesar. editor. Yoshida, Sanichiro. editor. Lamberti, Luciano. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-06986-9
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5. 
Cover image for Special Topics in Structural Dynamics, Volume 6 Proceedings of the 33rd IMAC, A Conference and Exposition on Structural Dynamics, 2015
Special Topics in Structural Dynamics, Volume 6 Proceedings of the 33rd IMAC, A Conference and Exposition on Structural Dynamics, 2015
Author 
Allemang, Randall. editor. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-15048-2
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6. 
Cover image for Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Author 
Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.
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ONLINE(342225.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414
ebrary http://site.ebrary.com/id/10881255
John Wiley http://dx.doi.org/10.1002/9783527681075
MyiLibrary http://www.myilibrary.com?id=615339
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7. 
Cover image for Measurement, instrumentation, and sensors handbook
Measurement, instrumentation, and sensors handbook
Author 
Eren, Halit (Professor of electrical engineering), editor. Webster, John G., 1932- editor.
Preferred Shelf Number 
QC39 .M393 2014
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8. 
Cover image for Measurement, instrumentation, and sensors handbook
Measurement, instrumentation, and sensors handbook
Author 
Webster, John G., 1932- editor. Eren, Halit (Professor of electrical engineering), editor.
Preferred Shelf Number 
QC39 .M393 2014
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9. 
Cover image for Optical magnetometry
Optical magnetometry
Author 
Budker, Dmitry. Jackson Kimball, Derek F.
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ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=529666
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10. 
Cover image for Handbook of optical dimensional metrology
Handbook of optical dimensional metrology
Author 
Harding, Kevin G.
Preferred Shelf Number 
T50 .H268 2013
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11. 
Cover image for Optical methods for solid mechanics : a full-field approach
Optical methods for solid mechanics : a full-field approach
Author 
Rastogi, P. K. (Pramod K.) Hack, Erwin.
Preferred Shelf Number 
QC367 O68 2012
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12. 
Cover image for Optical imaging and metrology advanced technologies
Optical imaging and metrology advanced technologies
Author 
Osten, Wolfgang. Reingand, Nadya.
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Wiley http://dx.doi.org/10.1002/9783527648443
http://site.ebrary.com/lib/alltitles/Doc?id=10575536
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