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613. 
Cover image for Control systems engineering
Control systems engineering
Author 
Nise, Norman S.
Preferred Shelf Number 
TJ213 .N497 2008
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614. 
Cover image for Nanotechnology-Enabled Sensors
Nanotechnology-Enabled Sensors
Author 
Kalantar-zadeh, Kourosh. author. Fry, Benjamin. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-68023-1
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615. 
Cover image for Analog Integrated Circuits for Communication Principles, Simulation and Design
Analog Integrated Circuits for Communication Principles, Simulation and Design
Author 
Pederson, Donald O. author. Mayaram, Kartikeya. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-68030-9
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616. 
Cover image for Polarization Effects in Semiconductors From Ab InitioTheory to Device Applications
Polarization Effects in Semiconductors From Ab InitioTheory to Device Applications
Author 
Wood, Colin. editor. Jena, Debdeep. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-68319-5
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617. 
Cover image for Creating Assertion-Based IP
Creating Assertion-Based IP
Author 
Foster, Harry D. author. Krolnik, Adam C. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-68398-0
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618. 
Cover image for Networked Sensing Information and Control
Networked Sensing Information and Control
Author 
Saligrama, Venkatesh. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-68845-9
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619. 
Cover image for Power Distribution Networks with On-Chip Decoupling Capacitors
Power Distribution Networks with On-Chip Decoupling Capacitors
Author 
Popovich, Mikhhail. author. Mezhiba, Andrey V. author. Friedman, Eby G. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-71601-5
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620. 
Cover image for Standardized Functional Verification
Standardized Functional Verification
Author 
Wiemann, Alan. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-71733-3
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621. 
Cover image for FinFETs and Other Multi-Gate Transistors
FinFETs and Other Multi-Gate Transistors
Author 
Colinge, Jean-Pierre. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-71752-4
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622. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-74747-7
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623. 
Cover image for Design and Modeling of Millimeter-Wave CMOS Circuits for Wireless Transceivers Era of Sub-100nm Technology
Design and Modeling of Millimeter-Wave CMOS Circuits for Wireless Transceivers Era of Sub-100nm Technology
Author 
Lai, Ivan Chee-Hong. author. Fujishima, Minoru. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-1-4020-6999-4
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624. 
Cover image for Functional Verification Coverage Measurement and Analysis
Functional Verification Coverage Measurement and Analysis
Author 
Piziali, Andrew. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/b117979
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