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1. 
Cover image for Scalable Hardware Verification with Symbolic Simulation
Scalable Hardware Verification with Symbolic Simulation
Author 
Bertacco, Valeria. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-29906-8
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Cover image for Knowledge Enterprise: Intelligent Strategies in Product Design, Manufacturing, and Management Proceedings of PROLAMAT 2006, IFIP TC5 International Conference, June 15–17, 2006, Shanghai, China
Knowledge Enterprise: Intelligent Strategies in Product Design, Manufacturing, and Management Proceedings of PROLAMAT 2006, IFIP TC5 International Conference, June 15–17, 2006, Shanghai, China
Author 
Wang, Kesheng. editor. Kovacs, George L. editor. Wozny, Michael. editor. Fang, Minglun. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-34403-9
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Cover image for Abstraction Refinement for Large Scale Model Checking
Abstraction Refinement for Large Scale Model Checking
Author 
Wang, Chao. author. Hachtel, Gary D. author. Somenzi, Fabio. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-34600-7
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Cover image for The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
Author 
Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-34609-0
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5. 
Cover image for Innovation in Life Cycle Engineering and Sustainable Development
Innovation in Life Cycle Engineering and Sustainable Development
Author 
Brissaud, Daniel. editor. Tichkiewitch, Serge. editor. Zwolinski, Peggy. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-4617-0
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6. 
Cover image for A Roadmap for Formal Property Verification
A Roadmap for Formal Property Verification
Author 
DasGupta, Pallab. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-4758-9
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7. 
Cover image for Practical Grey-box Process Identification Theory and Applications
Practical Grey-box Process Identification Theory and Applications
Author 
Bohlin, Torsten. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-84628-403-1
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8. 
Cover image for Electromagnetic Compatibility of Integrated Circuits Techniques for low emission and susceptibility
Electromagnetic Compatibility of Integrated Circuits Techniques for low emission and susceptibility
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Ben Dhia, Sonia. editor. Ramdani, Mohamed. editor. Sicard, Etienne. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137864
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Cover image for Systemverilog for Verification A Guide to Learning the Testbench Language Features
Systemverilog for Verification A Guide to Learning the Testbench Language Features
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Spear, Chris. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138536
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10. 
Cover image for Leakage in Nanometer CMOS Technologies
Leakage in Nanometer CMOS Technologies
Author 
Narendra, Siva G. author. Chandrakasan, Anantha. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-28133-9
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11. 
Cover image for Rapid Prototyping of Digital Systems
Rapid Prototyping of Digital Systems
Author 
Hamblen, James O. author. Hall, Tyson S. author. Furman, Michael D. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-28965-8
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12. 
Cover image for Embedded System Design
Embedded System Design
Author 
Marwedel, Peter. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-30087-2
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