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697. 
Cover image for Circuit and Interconnect Design for RF and High Bit-Rate Applications
Circuit and Interconnect Design for RF and High Bit-Rate Applications
Author 
Veenstra, Hugo. author. Long, John R. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-6884-3
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698. 
Cover image for RF Imperfections in High-rate Wireless Systems Impact and Digital Compensation
RF Imperfections in High-rate Wireless Systems Impact and Digital Compensation
Author 
Schenk, Tim. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-6903-1
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699. 
Cover image for Analog Circuit Design Sensors, Actuators and Power Drivers; Integrated Power Amplifiers from Wireline to RF; Very High Frequency Front Ends
Analog Circuit Design Sensors, Actuators and Power Drivers; Integrated Power Amplifiers from Wireline to RF; Very High Frequency Front Ends
Author 
Casier, Herman. editor. Steyaert, Michiel. editor. Roermund, Arthur H. M. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8263-4
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700. 
Cover image for Embedded Systems Specification and Design Languages Selected contributions from FDL’07
Embedded Systems Specification and Design Languages Selected contributions from FDL’07
Author 
Villar, Eugenio. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8297-9
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701. 
Cover image for ESD Protection Device and Circuit Design for Advanced CMOS Technologies
ESD Protection Device and Circuit Design for Advanced CMOS Technologies
Author 
Semenov, Oleg. author. Sarbishaei, Hossein. author. Sachdev, Manoj. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8301-3
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702. 
Cover image for Nanometer CMOS ICs From basics to ASICs
Nanometer CMOS ICs From basics to ASICs
Author 
Veendrick, H. J. M. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8333-4
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703. 
Cover image for CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
Author 
Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8363-1
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704. 
Cover image for Error Correction Codes for Non-Volatile Memories
Error Correction Codes for Non-Volatile Memories
Author 
Micheloni, R. author. Marelli, A. author. Ravasio, R. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8391-4
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705. 
Cover image for Practical Aspects of Embedded System Design using Microcontrollers
Practical Aspects of Embedded System Design using Microcontrollers
Author 
Parab, Jivan S. author. Shinde, Santosh A. author. Shelake, Vinod G. author. Kamat, Rajanish K. author. Naik, Gourish M. author.
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http://dx.doi.org/10.1007/978-1-4020-8393-8
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706. 
Cover image for Low Power Uwb Cmos Radar Sensors
Low Power Uwb Cmos Radar Sensors
Author 
Paulino, Nuno. author. Garção, Adolfo Steiger. author. Goes, João. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8410-2
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707. 
Cover image for New Methods of Concurrent Checking
New Methods of Concurrent Checking
Author 
Göessel, Michael. author. Ocheretny, Vitaly. author. Sogomonyan, Egor. author. Marienfeld, Daniel. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8420-1
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708. 
Cover image for Digital VLSI Design with Verilog A Textbook from Silicon Valley Technical Institute
Digital VLSI Design with Verilog A Textbook from Silicon Valley Technical Institute
Author 
Williams, John. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8446-1
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