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61. 
Cover image for Reliability models for engineers and scientists
Reliability models for engineers and scientists
Author 
Kaminskiy, Mark, 1946-
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62. 
Cover image for Analog IC Reliability in Nanometer CMOS
Analog IC Reliability in Nanometer CMOS
Author 
Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)
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ONLINE(331961.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-6163-0
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63. 
Cover image for Reliability and maintenance networks and systems
Reliability and maintenance networks and systems
Author 
Beichelt, Frank, 1942- Tittmann, Peter.
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64. 
Cover image for Reliability and availability of cloud computing
Reliability and availability of cloud computing
Author 
Bauer, Eric. Adams, Randee. Wiley InterScience (Online service)
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ONLINE
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788
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65. 
Cover image for Semiconductor packaging materials interaction and reliability
Semiconductor packaging materials interaction and reliability
Author 
Chen, Andrea. Lo, Randy.
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66. 
Cover image for Semiconductor process reliability in practice
Semiconductor process reliability in practice
Author 
Gan, Zhenghao. Wong, Waisum. Liou, Juin J.
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67. 
Cover image for Accelerated reliability and durability testing technology
Accelerated reliability and durability testing technology
Author 
Klyatis, Lev M.
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
ebrary http://site.ebrary.com/id/10592157
http://swb.eblib.com/patron/FullRecord.aspx?p=693204
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68. 
Cover image for Lead Free Solder Mechanics and Reliability
Lead Free Solder Mechanics and Reliability
Author 
Pang, John Hock Lye. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-1-4614-0463-7
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69. 
Cover image for Multistate systems reliability theory with applications
Multistate systems reliability theory with applications
Author 
Natvig, Bent, 1946-
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John Wiley http://dx.doi.org/10.1002/9780470977088
http://site.ebrary.com/lib/alltitles/Doc?id=10469650
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70. 
Cover image for Measures of interobserver agreement and reliability
Measures of interobserver agreement and reliability
Author 
Shoukri, M. M. (Mohamed M.) Shoukri, M. M. (Mohamed M.). Measures of interobserver agreement.
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71. 
Cover image for Transportation systems reliability and safety
Transportation systems reliability and safety
Author 
Dhillon, B. S. (Balbir S.), 1947-
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72. 
Cover image for Semiconductor Power Devices Physics, Characteristics, Reliability
Semiconductor Power Devices Physics, Characteristics, Reliability
Author 
Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-11125-9
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