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781. 
Cover image for Computer Network Security Third International Workshop on Mathematical Methods, Models, and Architectures for Computer Network Security, MMM-ACNS 2005, St. Petersburg, Russia, September 24-28, 2005. Proceedings
Computer Network Security Third International Workshop on Mathematical Methods, Models, and Architectures for Computer Network Security, MMM-ACNS 2005, St. Petersburg, Russia, September 24-28, 2005. Proceedings
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Gorodetsky, Vladimir. editor. Kotenko, Igor. editor. Skormin, Victor. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/11560326
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782. 
Cover image for Computer Safety, Reliability, and Security 24th International Conference, SAFECOMP 2005, Fredrikstad, Norway, September 28-30, 2005. Proceedings
Computer Safety, Reliability, and Security 24th International Conference, SAFECOMP 2005, Fredrikstad, Norway, September 28-30, 2005. Proceedings
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Winther, Rune. editor. Gran, Bjørn Axel. editor. Dahll, Gustav. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/11563228
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783. 
Cover image for Security in Pervasive Computing Second International Conference, SPC 2005, Boppard, Germany, April 6-8, 2005. Proceedings
Security in Pervasive Computing Second International Conference, SPC 2005, Boppard, Germany, April 6-8, 2005. Proceedings
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Hutter, Dieter. editor. Ullmann, Markus. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b135497
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784. 
Cover image for Manage IT! Organizing IT Demand and IT Supply
Manage IT! Organizing IT Demand and IT Supply
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Thiadens, Theo. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3710-4
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785. 
Cover image for Outsourcing to India The Offshore Advantage
Outsourcing to India The Offshore Advantage
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Kobayashi-Hillary, Mark. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b106280
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786. 
Cover image for Secure Systems Development with UML
Secure Systems Development with UML
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Jürjens, Jan. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137706
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787. 
Cover image for Best Practices in Software Measurement How to use metrics to improve project and process performance
Best Practices in Software Measurement How to use metrics to improve project and process performance
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Ebert, Christof. author. Bundschuh, Manfred. author. Dumke, Reiner. author. Schmietendorf, Andreas. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138013
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788. 
Cover image for Engineering and Managing Software Requirements
Engineering and Managing Software Requirements
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Aurum, Aybüke. editor. Wohlin, Claes. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-28244-0
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789. 
Cover image for Advanced Studies in Biometrics Summer School on Biometrics, Alghero, Italy, June 2-6, 2003. Revised Selected Lectures and Papers
Advanced Studies in Biometrics Summer School on Biometrics, Alghero, Italy, June 2-6, 2003. Revised Selected Lectures and Papers
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Tistarelli, Massimo. editor. Bigun, Josef. editor. Grosso, Enrico. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b136906
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790. 
Cover image for Extreme Programming and Agile Processes in Software Engineering 6th International Conference, XP 2005, Sheffield, UK, June 18-23, 2005. Proceedings
Extreme Programming and Agile Processes in Software Engineering 6th International Conference, XP 2005, Sheffield, UK, June 18-23, 2005. Proceedings
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Baumeister, Hubert. editor. Marchesi, Michele. editor. Holcombe, Mike. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137278
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791. 
Cover image for SDL 2005: Model Driven 12th International SDL Forum, Grimstad, Norway, June 20-23, 2005. Proceedings
SDL 2005: Model Driven 12th International SDL Forum, Grimstad, Norway, June 20-23, 2005. Proceedings
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Prinz, Andreas. editor. Reed, Rick. editor. Reed, Jeanne. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137793
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792. 
Cover image for Computational Intelligence and Security International Conference, CIS 2005, Xi’an, China, December 15-19, 2005, Proceedings Part I
Computational Intelligence and Security International Conference, CIS 2005, Xi’an, China, December 15-19, 2005, Proceedings Part I
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Hao, Yue. editor. Liu, Jiming. editor. Wang, Yuping. editor. Cheung, Yiu-ming. editor. Yin, Hujun. editor.
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http://dx.doi.org/10.1007/11596448
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