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97. 
Cover image for Understanding Error Control Coding
Understanding Error Control Coding
Author 
Sanvicente, Emilio. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-030-05840-1
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98. 
Cover image for Equivalent-Small-Parameter Analysis of DC/DC Switched-Mode Converter
Equivalent-Small-Parameter Analysis of DC/DC Switched-Mode Converter
Author 
Chen, Yanfeng. author. Zhang, Bo. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-2574-8
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99. 
Cover image for Automated Broad and Narrow Band Impedance Matching for RF and Microwave Circuits
Automated Broad and Narrow Band Impedance Matching for RF and Microwave Circuits
Author 
Banerjee, Amal. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-99001-9
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100. 
Cover image for Light-Emitting Diodes Materials, Processes, Devices and Applications
Light-Emitting Diodes Materials, Processes, Devices and Applications
Author 
Li, Jinmin. editor. Zhang, G. Q. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-99211-2
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101. 
Cover image for Security Policy in System-on-Chip Designs Specification, Implementation and Verification
Security Policy in System-on-Chip Designs Specification, Implementation and Verification
Author 
Ray, Sandip. author. Basak, Abhishek. author. Bhunia, Swarup. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-93464-8
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102. 
Cover image for Device Physics, Modeling, Technology, and Analysis for Silicon MESFET
Device Physics, Modeling, Technology, and Analysis for Silicon MESFET
Author 
Amiri, Iraj Sadegh. author. Mohammadi, Hossein. author. Hosseinghadiry, Mahdiar. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-04513-5
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103. 
Cover image for Reliability Physics and Engineering Time-To-Failure Modeling
Reliability Physics and Engineering Time-To-Failure Modeling
Author 
McPherson, J. W. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-93683-3
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104. 
Cover image for Radiation Effects on Integrated Circuits and Systems for Space Applications
Radiation Effects on Integrated Circuits and Systems for Space Applications
Author 
Velazco, Raoul. editor. McMorrow, Dale. editor. Estela, Jaime. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-04660-6
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105. 
Cover image for Compact Size Wireless Power Transfer Using Defected Ground Structures
Compact Size Wireless Power Transfer Using Defected Ground Structures
Author 
Hekal, Sherif. author. Allam, Ahmed. author. Abdel-Rahman, Adel B. author. Pokharel, Ramesh K. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-8047-1
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106. 
Cover image for Heterogeneous Integrations
Heterogeneous Integrations
Author 
Lau, John H. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-7224-7
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107. 
Cover image for Memristive Nonlinear Electronic Circuits Dynamics, Synchronization and Applications
Memristive Nonlinear Electronic Circuits Dynamics, Synchronization and Applications
Author 
Rahma, Fadhil. author. Muneam, Saif. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-11921-8
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108. 
Cover image for Communications, Signal Processing, and Systems Proceedings of the 2018 CSPS Volume I: Communications
Communications, Signal Processing, and Systems Proceedings of the 2018 CSPS Volume I: Communications
Author 
Liang, Qilian. editor. Liu, Xin. editor. Na, Zhenyu. editor. Wang, Wei. editor. Mu, Jiasong. editor.
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https://doi.org/10.1007/978-981-13-6264-4
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