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Cover image for Analog IC Reliability in Nanometer CMOS
Title:
Analog IC Reliability in Nanometer CMOS
Author:
Maricau, Elie. author.
ISBN:
9781461461630
Physical Description:
XVI, 198 p. 95 illus., 27 illus. in color. online resource.
Series:
Analog Circuits and Signal Processing
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E-Book 331961-1001 ONLINE(331961.1)
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