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Title:
Physical measurement and analysis of thin films
Author:
Eastern Analytical Symposium (1967 : New York).
Publication Information:
New York : Plenum, 1969.
Physical Description:
xi, 194 s. : res.
Series:
Progress in analytical chemistry ; v.2
Series Title:
Progress in analytical chemistry ; v.2
Subject Term:
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Book 7.2/12/448946 QC 176 E2 1967
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