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Cover image for Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
Title:
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
Author:
Walkosz, Weronika. author.
ISBN:
9781441978172
Physical Description:
XIV, 110 p. online resource.
Series:
Springer Theses
Series Title:
Springer Theses
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E-Book 172989-2001 ONLINE
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