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1. 
Cover image for Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices
Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices
Author 
Gusev, Evgeni. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-4367-8
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2. 
Cover image for Nanoscale Transistors Device Physics, Modeling and Simulation
Nanoscale Transistors Device Physics, Modeling and Simulation
Author 
Lundstrom, Mark S. author. Guo, Jing. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/0-387-28003-0
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3. 
Cover image for MEMS/NEMS Handbook Techniques and Applications
MEMS/NEMS Handbook Techniques and Applications
Author 
Leondes, Cornelius T. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b136111
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4. 
Cover image for Gallium Nitride Processing for Electronics, Sensors and Spintronics
Gallium Nitride Processing for Electronics, Sensors and Spintronics
Author 
Pearton, Stephen J. author. Abernathy, Cammy R. author. Ren, Fan. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-84628-359-0
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5. 
Cover image for Carbon The Future Material for Advanced Technology Applications
Carbon The Future Material for Advanced Technology Applications
Author 
Messina, Giacomo. editor. Santangelo, Saveria. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b105262
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6. 
Cover image for Nanotechnology Assessment and Perspectives
Nanotechnology Assessment and Perspectives
Author 
Brune, H. author. Ernst, H. author. Grunwald, A. author. Grünwald, W. author. Hofmann, H. author.
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http://dx.doi.org/10.1007/3-540-32820-3
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