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1. 
Cover image for Vacuum Electronics Components and Devices
Vacuum Electronics Components and Devices
Author 
Eichmeier, Joseph A. editor. Thumm, Manfred K. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-3-540-71929-8
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2. 
Cover image for Polarization Effects in Semiconductors From Ab InitioTheory to Device Applications
Polarization Effects in Semiconductors From Ab InitioTheory to Device Applications
Author 
Wood, Colin. editor. Jena, Debdeep. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-68319-5
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3. 
Cover image for Physical Limitations of Semiconductor Devices
Physical Limitations of Semiconductor Devices
Author 
Vashchenko, V. A. author. Sinkevitch, V. F. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-74514-5
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4. 
Cover image for Wafer Level 3-D ICs Process Technology
Wafer Level 3-D ICs Process Technology
Author 
Tan, Chuan Seng. editor. Gutmann, Ronald J. editor. Reif, L. Rafael. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-76534-1
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5. 
Cover image for Piezoelectric and Acoustic Materials for Transducer Applications
Piezoelectric and Acoustic Materials for Transducer Applications
Author 
Safari, Ahmad. editor. Akdoğan, E. Koray. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-76540-2
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6. 
Cover image for Adaptive Structural Systems with Piezoelectric Transducer Circuitry
Adaptive Structural Systems with Piezoelectric Transducer Circuitry
Author 
Tang, Jiong. author. Wang, Kon-Well. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-78751-0
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7. 
Cover image for Memories in Wireless Systems
Memories in Wireless Systems
Author 
Micheloni, Rino. editor. Campardo, Giovanni. editor. Olivo, Piero. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-79078-5
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8. 
Cover image for Piezoelectric Transducers and Applications
Piezoelectric Transducers and Applications
Author 
Vives, Antonio Arnau. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-77508-9
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