Search Results for Science.

1.

Geometric Science of Information First International Conference, GSI 2013, Paris, France, August 28-30, 2013. Proceedings

Author

Nielsen, Frank. editor. Barbaresco, Frédéric. editor. SpringerLink (Online service)

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ONLINE(334879.1)

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http://dx.doi.org/10.1007/978-3-642-40020-9

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2.

Cover image for Graph-Based Representations in Pattern Recognition 8th IAPR-TC-15 International Workshop, GbRPR 2011, Münster, Germany, May 18-20, 2011. Proceedings

Graph-Based Representations in Pattern Recognition 8th IAPR-TC-15 International Workshop, GbRPR 2011, Münster, Germany, May 18-20, 2011. Proceedings

Author

Jiang, Xiaoyi. editor. Ferrer, Miquel. editor. Torsello, Andrea. editor. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/978-3-642-20844-7

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3.

Emerging Trends in Visual Computing LIX Fall Colloquium, ETVC 2008, Palaiseau, France, November 18-20, 2008. Revised Invited Papers

Author

Nielsen, Frank. editor. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/978-3-642-00826-9

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4.

Cover image for Graph-Based Representations in Pattern Recognition 7th IAPR-TC-15 International Workshop, GbRPR 2009, Venice, Italy, May 26-28, 2009. Proceedings

Graph-Based Representations in Pattern Recognition 7th IAPR-TC-15 International Workshop, GbRPR 2009, Venice, Italy, May 26-28, 2009. Proceedings

Author

Torsello, Andrea. editor. Escolano, Francisco. editor. Brun, Luc. editor. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/978-3-642-02124-4

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5.

Robot Vision Second International Workshop, RobVis 2008, Auckland, New Zealand, February 18-20, 2008. Proceedings

Author

Sommer, Gerald. editor. Klette, Reinhard. editor. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/978-3-540-78157-8

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6.

Cover image for Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, SSPR & SPR 2008, Orlando, USA, December 4-6, 2008. Proceedings

Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, SSPR & SPR 2008, Orlando, USA, December 4-6, 2008. Proceedings

Author

Vitoria Lobo, Niels. editor. Kasparis, Takis. editor. Roli, Fabio. editor. Kwok, James T. editor. Georgiopoulos, Michael. editor.

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ONLINE

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http://dx.doi.org/10.1007/978-3-540-89689-0

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7.

Cover image for Automated Deduction in Geometry 6th International Workshop, ADG 2006, Pontevedra, Spain, August 31-September 2, 2006. Revised Papers

Automated Deduction in Geometry 6th International Workshop, ADG 2006, Pontevedra, Spain, August 31-September 2, 2006. Revised Papers

Author

Botana, Francisco. editor. Recio, Tomas. editor. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/978-3-540-77356-6

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8.

Cover image for Graph-Based Representations in Pattern Recognition 6th IAPR-TC-15 International Workshop, GbRPR 2007, Alicante, Spain, June 11-13, 2007. Proceedings

Graph-Based Representations in Pattern Recognition 6th IAPR-TC-15 International Workshop, GbRPR 2007, Alicante, Spain, June 11-13, 2007. Proceedings

Author

Escolano, Francisco. editor. Vento, Mario. editor. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/978-3-540-72903-7

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9.

Automated Deduction in Geometry 5th International Workshop, ADG 2004, Gainesville, FL, USA, September 16-18, 2004. Revised Papers

Author

Hong, Hoon. editor. Wang, Dongming. editor. SpringerLink (Online service)

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ONLINE

Electronic Access

http://dx.doi.org/10.1007/11615798

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10.

Cover image for Graphics Recognition. Ten Years Review and Future Perspectives 6th Internation Workshop, GREC 2005, Hong Kong, China, August 25-26, 2005, Revised Selected Papers

Graphics Recognition. Ten Years Review and Future Perspectives 6th Internation Workshop, GREC 2005, Hong Kong, China, August 25-26, 2005, Revised Selected Papers

Author

Liu, Wenyin. editor. Lladós, Josep. editor. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/11767978

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11.

Cover image for Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings

Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings

Author

Yeung, Dit-Yan. editor. Kwok, James T. editor. Fred, Ana. editor. Roli, Fabio. editor. Ridder, Dick. editor.

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ONLINE

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http://dx.doi.org/10.1007/11815921

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