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Cover image for Measurement and modeling of silicon heterostructure devices
Title:
Measurement and modeling of silicon heterostructure devices
Author:
Cressler, John D.
ISBN:
9781420066937
Publication Information:
Boca Raton, FL : CRC Press, c2008.
Physical Description:
200 p. : ill.
Subject Term:
Bipolar transistors -- Mathematical models.

Bipolar transistors.

Heterostructures.

Integrated circuits -- Design and construction.
Added Author:
Cressler, John D.
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