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1. 
Cover image for HF Filter Design and Computer Simulation
HF Filter Design and Computer Simulation
Author 
Rhea, Randall W.
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http://dx.doi.org/10.1049/SBEW010E
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2. 
Cover image for Summer of Simulation 50 Years of Seminal Computer Simulation Research
Summer of Simulation 50 Years of Seminal Computer Simulation Research
Author 
Sokolowski, John. editor. Durak, Umut. editor. Mustafee, Navonil. editor. Tolk, Andreas. editor. (orcid)0000-0002-4201-8757 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-17164-3
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3. 
Cover image for Computer-aided graphing and simulation tools for AutoCAD users
Computer-aided graphing and simulation tools for AutoCAD users
Author 
Simionescu, P. A., 1968- author.
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ONLINE(356711.1)
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Distributed by publisher. Purchase or institutional license may be required for access.
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4. 
Cover image for Advanced CAD Modeling Explicit, Parametric, Free-Form CAD and Re-engineering
Advanced CAD Modeling Explicit, Parametric, Free-Form CAD and Re-engineering
Author 
Vukašinović, Nikola. author. Duhovnik, Jože. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-02399-7
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5. 
Cover image for Ray Tracing: A Tool for All
Ray Tracing: A Tool for All
Author 
Peddie, Jon. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-17490-3
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6. 
Cover image for Advances in Manufacturing, Production Management and Process Control Joint proceedings of the AHFE 2018 International Conference on Advanced Production Management and Process Control, the AHFE International Conference on Human Aspects of Advanced Manufacturing, and the AHFE International Conference on Additive Manufacturing, Modeling Systems and 3D Prototyping, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USA
Advances in Manufacturing, Production Management and Process Control Joint proceedings of the AHFE 2018 International Conference on Advanced Production Management and Process Control, the AHFE International Conference on Human Aspects of Advanced Manufacturing, and the AHFE International Conference on Additive Manufacturing, Modeling Systems and 3D Prototyping, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USA
Author 
Karwowski, Waldemar. editor. Trzcielinski, Stefan. editor. Mrugalska, Beata. editor. Di Nicolantonio, Massimo. editor. Rossi, Emilio. editor.
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https://doi.org/10.1007/978-3-319-94196-7
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7. 
Cover image for Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits
Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits
Author 
Yu, Wenjian. author. Wang, Xiren. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-642-54298-5
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