Title:
Physical measurement and analysis of thin films
Author:
Eastern Analytical Symposium (1967 : New York).
Conference Author:
Publication Information:
New York : Plenum, 1969.
Physical Description:
xi, 194 s. : res.
Series:
Progress in analytical chemistry ; v.2
Series Title:
Progress in analytical chemistry ; v.2
Subject Term:
Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | Book | 7.2/12/448946 | QC 176 E2 1967 | Searching... | Searching... |