Title:
Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM
Author:
Egerton, Ray F. author.
ISBN:
9780387260167
Physical Description:
XII, 202 p. 122 illus. online resource.
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/b136495Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 165220-2001 | ONLINE | Searching... | Searching... |