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Cover image for Logic testing and design for testability
Title:
Logic testing and design for testability
Author:
Fujiwara, Hideo.
ISBN:
9780262256186
Publication Information:
Cambridge, Mass. : MIT Press, c1985.
Physical Description:
1 online resource (x, 284 p.) : ill.
Series:
MIT Press series in computer systems
Series Title:
MIT Press series in computer systems
Subject Term:
Logic circuits -- Testing.

Integrierte Schaltung.

Test.

VLSI.
Electronic Access:
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264
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