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Cover image for Computed electron micrographs and defect identification
Title:
Computed electron micrographs and defect identification
Author:
Head, A. K.
ISBN:
9780720417579

9780444601476
Publication Information:
Amsterdam, North-Holland Pub. Co., 1973.
Physical Description:
1 online resource (x, 400 p. with illus.)
Series:
Defects in crystalline solids, v. 7
Series Title:
Defects in crystalline solids, v. 7
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