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Title:
Reliability and failure of electronic materials and devices
Author:
Ohring, Milton, 1936-
ISBN:
9780080575520
Edition:
Second edition.
Physical Description:
1 online resource.
General Note:
Includes index.
Machine generated contents note: CH 1 An Overview of Electronic Devices and Their Reliability CH 2 Electronic Devices: Materials Properties Determine How They Operate and Are Fabricated CH 3 Defects, Contamination and Yield CH 4 The Mathematics of Failure and Reliability CH 5 Mass Transport-Induced Failure Ch 6 Electronic Charge-Induced Damage CH 7 Environmental Damage to Electronic Products CH 8 Packaging Materials, Processes, and Stresses CH 9 Degradation of Contacts and Packages CH 10 Degradation and Failure of Electro-Optical and Magnetic Materials and Devices CH 11 Characterization and Failure Analysis of Material, Devices and Packages CH 12 Future Directions and Reliability Issues.
Added Author:
Electronic Access:
ScienceDirect http://www.sciencedirect.com/science/book/9780120885749Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
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Searching... | E-Book | 355485-1001 | ONLINE(355485.1) | Searching... | Searching... |