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1. 
Cover image for Principles and Applications of NanoMEMS Physics
Principles and Applications of NanoMEMS Physics
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Santos, Héctor J. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b136228
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2. 
Cover image for Fundamentals of Semiconductors Physics and Materials Properties
Fundamentals of Semiconductors Physics and Materials Properties
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Yu, Peter Y. Cardona, Manuel. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137661
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3. 
Cover image for The Physics of Thin Film Optical Spectra An Introduction
The Physics of Thin Film Optical Spectra An Introduction
Author 
Stenzel, Olaf. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-27905-9
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4. 
Cover image for Applied Physics of Carbon Nanotubes Fundamentals of Theory, Optics and Transport Devices
Applied Physics of Carbon Nanotubes Fundamentals of Theory, Optics and Transport Devices
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Rotkin, Slava V. editor. Subramoney, Shekhar. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-28075-8
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5. 
Cover image for Semiconductor Optics
Semiconductor Optics
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Klingshirn, Claus. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138175
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6. 
Cover image for Field Emission in Vacuum Microelectronics
Field Emission in Vacuum Microelectronics
Author 
Fursey, George. author. Brodie, Ivor. editor. Schwoebel, Paul. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b139052
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7. 
Cover image for Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons
Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons
Author 
Schubert, Mathias. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b11964
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8. 
Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Author 
Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3019-3
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9. 
Cover image for Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
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Sikula, Josef. editor. Levinshtein, Michael. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-2170-4
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10. 
Cover image for Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Kiev, Ukraine 26–30 April 2004
Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Proceedings of the NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment Kiev, Ukraine 26–30 April 2004
Author 
Flandre, Denis. editor. Nazarov, Alexei N. editor. Hemment, Peter L.F. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3013-4
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11. 
Cover image for Quantum Dots: Fundamentals, Applications, and Frontiers Proceedings of the NATO Advanced Research Workshop on Quantum Dots: Fundamentals, Applications and Frontiers Crete, Greece, 20–24 July 2003
Quantum Dots: Fundamentals, Applications, and Frontiers Proceedings of the NATO Advanced Research Workshop on Quantum Dots: Fundamentals, Applications and Frontiers Crete, Greece, 20–24 July 2003
Author 
Joyce, Bruce A. editor. Kelires, Pantelis C. editor. Naumovets, Anton G. editor. Vvedensky, Dimitri D. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3315-X
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12. 
Cover image for Nanostructured and Advanced Materials for Applications in Sensor, Optoelectronic and Photovoltaic Technology Proceedings of the NATO Advanced Study Institute on Nanostructured and Advanced Materials for Applications in Sensors, Optoelectronic and Photovoltaic Technology Sozopol, Bulgaria 6–17 September 2004
Nanostructured and Advanced Materials for Applications in Sensor, Optoelectronic and Photovoltaic Technology Proceedings of the NATO Advanced Study Institute on Nanostructured and Advanced Materials for Applications in Sensors, Optoelectronic and Photovoltaic Technology Sozopol, Bulgaria 6–17 September 2004
Author 
Vaseashta, A. editor. Dimova-Malinovska, D. editor. Marshall, J. M. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3562-4
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