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1. 
Cover image for Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysis
Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysis
Author 
Limnios, Nikolaos. author. Barbu, Vlad Stefan. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-73173-5
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2. 
Cover image for Applied Nonparametric Statistics in Reliability
Applied Nonparametric Statistics in Reliability
Author 
Gámiz, M. Luz. author. Kulasekera, K. B. author. Limnios, Nikolaos. author. Lindqvist, Bo Henry. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-85729-118-9
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3. 
Cover image for Advances in Degradation Modeling Applications to Reliability, Survival Analysis, and Finance
Advances in Degradation Modeling Applications to Reliability, Survival Analysis, and Finance
Author 
Nikulin, M.S. editor. Limnios, Nikolaos. editor. Balakrishnan, N. editor. Kahle, Waltraud. editor. Huber-Carol, Catherine. editor.
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-8176-4924-1
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4. 
Cover image for Statistical Models and Methods for Biomedical and Technical Systems
Statistical Models and Methods for Biomedical and Technical Systems
Author 
Vonta, Filia. editor. Nikulin, Mikhail. editor. Limnios, Nikolaos. editor. Huber-Carol, Catherine. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-8176-4619-6
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